AMIS−30523
http://onsemi.com
4
Table 1. PIN DESCRIPTION
Name Equivalent SchematicTypeDescriptionPin
MOTYN 31, 32 Positive end of phase Y coil output Driver Output
/ 33 No function (to be left open in normal operation)
MOTXN 34, 35 Positive end of phase X coil output Driver Output
GND 36, 37 Ground, heat sink Supply
MOTXP 38, 39 Negative end of phase X coil output Driver Output
VBB 40, 41 High voltage supply input Supply Type 3
PORB/WD 42 Power−on−reset and watchdog reset output (open drain) Digital Output Type 2
TST0 43 Test pin input (to be tied to ground in normal operation) Digital Input
/ 44 No function (to be left open in normal operation)
DO 45 SPI data output (open drain) Digital Output Type 4
VDD 46 5V Logic Supply Output (needs external decoupling
capacitor)
Supply Type 6
GND 47 Ground Supply
CANH 48 High−level CAN bus line (high in dominant mode) Analog Output
CANL 49 Low−level CAN bus line (low in dominant mode) Analog Output
/ 50 No function (to be left open in normal operation)
STB 51 CAN stand−by mode control input Digital Input
TXD 52 CAN transmit data input; low input ³ dominant driver;
internal pull−up current
Digital Input
Table 2. ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Min Max Unit
V
BB
Analog DC supply voltage (Note 1) −0.3 +40 V
V
CC
CAN Supply voltage −0.3 +7 V
V
CANH
,
V
CANL
,
V
SPLIT
DC voltage CANH ,CANL and VSPLIT (Note 2) −50 +50 V
V
TRANS
Transient voltage CANH, CANL and VSPLIT (Note 3) −300 +300 V
T
ST
Storage temperature −55 +150 °C
T
J
Junction Temperature under bias (Note 4) −40 +170 °C
V
ESD
Electrostatic discharges on component level, All pins (Note 5) −2 +2 kV
V
ESD
Electrostatic discharges on component level, All pins (Note 7) −500 +500 V
V
ESD
Electrostatic discharges on CANH, CANL and VSPLIT (Note 6) −6 +6 kV
V
ESD
Electrostatic discharges on CANH and CANL (Note 7) −500 +500 V
V
ESD
Electrostatic discharges on component level, HiV pins (Note 6) −6 +6 kV
Latch−up Static latch−up at all pins 100 mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. For limited time < 0.5 s.
2. For 0 < V
CC
< 5.25 V unlimited time
3. Applied transient waveforms in accordance with ISO 7637 part 3, test pulses 1, 2, 3a, and 3b.
4. Circuit functionality not guaranteed.
5. Standardized Human body model (100 pF via 1.5 kW, according to JEDEC EIA−JESD22−A114−B).
6. Standardized human body model electrostatic discharge (ESD) pulses (100 pF via 1.5 kW) stressed pin to ground.
7. Standardized charged device model ESD pulses when tested according to ESD STM5.3.1−1999.
