NCV7462
www.onsemi.com
6
Table 2. ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Min Max Unit
Vmax_VS Power supply voltage −0.3 40 V
Vmax_WU1−3 Wake pins DC and transient voltage −0.3 VS + 0.3 V
Vmax_OPOUT1/2 Opamp analog output voltage range −0.3 VS + 0.3 V
Vmax_OUT1−4
Vmax_OUT_HS
High−side output voltage range −0.3 VS + 0.3 V
Vmax_LS1/2
LS1/2 pin voltage range DC
LS1/2 pin transient voltage range (during flyback)
−0.3
−0.3
40
65
V
V
Vmax_LIN DC voltage on LIN pin −20 40 V
Vmax_INH DC voltage on INH pin −0.3 VS + 0.3 V
Vmax_CANH/L
Vmax_VSPLIT
DC voltage on pin CANH, CANL and VSPLIT −40 40 V
Vmax_VR1 Stabilized supply voltage, logic supply −0.3
min (5.5,
VS + 0.3)
V
Vmax_VR2 Stabilized supply voltage −0.3 28 V
Vmax_VCC_CAN Supply input for the CAN transceiver −0.3 5.5 V
Vmax_digIO
DC voltage at digital pins (RxDC, NRES, RxDL/INTN, SDI, SDO,
SCLK, CSN)
−0.3 VR1 + 0.3 V
Vmax_OP1/2(+/−) Opamp input voltage range −0.3 VS + 0.3 V
Vmax_TxDL(C)/FL
ASH
DC voltage at TxDL/FLASH and TxDC/FLASH inputs −0.3 28 V
Wmax_LS1/2 Maximum clamping energy on LS1/2 36 mJ
Imax_LS1/2
Maximum LS1/2 pin current
500 mA
Maximum LS1/2 pin current, transient or without VS supply
−120 mA
Imax_input Current injection into Vs related input pins 5 mA
ESD Human Body
Model
(100pF, 1500W)
All pins −2 +2
kV
Pins LIN, CANH/L, VSPLIT and WU1−3 to GND −4 +4
Pins OUT_HS, OUT1−4, LS1/2 to GND −4 +4
ESD following IEC
61000−4−2
(150 pF, 330 W)
Valid for pins VS, LIN, CANH/L, VSPLIT, WUx, OUT_HS, OUT1−4
− VS pin with reverse−protection and filtering capacitor
− VSPLIT pin stressed through split CAN termination
− WUx pins stressed through a serial resistor >10 kW
− OUT_HS, OUT1−4 pins with parallel capacitor 10 nF
−6 +6 kV
ESD Charged
Device Model
following
JESD22−C101/AE
C−Q100−011
All pins −500 +500 V
Corner pins −750 +750 V
Tj_mr Junction temperature −40 +170 °C
Tstg Storage Temperature Range −55 +150 °C
MSL Moisture Sensitivity Level (max. 260°C processing) MSL3
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
