CY28378
......................Document #: 38-07519 Rev. ** Page 16 of 21
Test and Measurement Set-up
For Differential CPU Output Signals
The following diagram shows lumped test load configurations
for the differential Host Clock Outputs.
CPUT
MULTSEL
T
PCB
T
PCB
CPUC




Measurement Point
2pF

IREF
Measurement Point
2pF
2.4V
0.4V
3.3V
0V
Tr Tf
1.5V
3.3V signals
tDC
Probe
Output under Test
Load Cap
-
-
Figure 5. Lumped Load For Single-Ended Output Signals (for AC Parameters Measurement)
CY28378
......................Document #: 38-07519 Rev. ** Page 17 of 21
Switching Waveforms
Note:
6. Device is not affected, VTT_PWRGD# is ignored.
FS_A, FS_B
VTT_PWRGD#
PWRGD_VRM
VDD Clock Gen
Clock State
Clock Outputs
Clock VCO
0.2-0.3mS
Delay
State 0
State 2 State 3
Wait for
VTT_PWRGD#
Sample Sels
Off
Off
On
On
State 1
Device is not affected,
VTT_PWRGD# is ignored
VTT_PWRGD# = Low
Delay
>0.25mS
S1
Power Off
S0
VDDA = 2.0V
Sample
Inputs straps
S2
Normal
Operation
Wait for 1.146ms
Enable Outputs
S3
VTT_PWRGD# = toggle
VDDA = off
Duty Cycle Timing
t
1B
(Single-ended Output)
t
1A
CY28378
......................Document #: 38-07519 Rev. ** Page 18 of 21
Switching Waveforms (continued)
Duty Cycle Timing (CPU Differential Output)
t
1B
t
1A
All Outputs Rise/Fall Time
OUTPUT
t
2
V
DD
0V
t
3
CPU-CPU Clock Skew
Host_b
Host
t
4
Host_b
Host
3V66-3V66 Clock Skew
3V66
3V66
t
5
PCI-PCI Clock Skew
PCI
PCI
t
6
3V66
PCI
t
7
3V66-PCI Clock Skew

CY28378OXC

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock Generators & Support Products System Clock for Pentium 4 and Intel Brookdale, 845 Chipsets
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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