13
FN8172.4
August 29, 2006
INSTRUCTION FORMAT
Read Wiper Counter Register (WCR)
Write Wiper Counter Register (WCR)
Read Data Register (DR)
Write Data Register (DR)
Global XFR Data Register (DR) to Wiper Counter Register (WCR)
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
Wiper Position
(Sent by X9268 on SDA)
M
A
C
K
S
T
O
P
0101A3A2A1A0 100100 0 P0
W
C
R
7
W
C
R
6
W
C
R
5
W
C
R
4
W
C
R
3
W
C
R
2
W
C
R
1
W
C
R
0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
Wiper Position
(Sent by Master on SDA)
S
A
C
K
S
T
O
P
0101A3A2A1A0 101000 0 P0
W
C
R
7
W
C
R
6
W
C
R
5
W
C
R
4
W
C
R
3
W
C
R
2
W
C
R
1
W
C
R
0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
Wiper Position
(Sent by X9268 on SDA)
M
A
C
K
S
T
O
P
01 0 1A3A2A1A0 1011RBRA 0 P0
W
C
R
7
W
C
R
6
W
C
R
5
W
C
R
4
W
C
R
3
W
C
R
2
W
C
R
1
W
C
R
0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
Wiper Position
(Sent by Master on SDA)
S
A
C
K
S
T
O
P
HIGH-VOLTAGE
WRITE CYCLE
0101A3A2A1A0 1100RBRA0 P0
W
C
R
7
W
C
R
6
W
C
R
5
W
C
R
4
W
C
R
3
W
C
R
2
W
C
R
1
W
C
R
0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
S
T
O
P
0 1 0 1 A3 A2 A1 A0 0 0 0 1 RB RA 0 0
X9268
14
FN8172.4
August 29, 2006
Global XFR Wiper Counter Register (WCR) to Data Register (DR)
Transfer Wiper Counter Register (WCR) to Data Register (DR)
Transfer Data Register (DR) to Wiper Counter Register (WCR)
Increment/Decrement Wiper Counter Register (WCR)
Notes: (1) “MACK”/”SACK”: stands for the acknowledge sent by the master/slave.
(2) “A3 ~ A0”: stands for the device addresses sent by the master.
(3) “X”: indicates that it is a “0” for testing purpose but physically it is a “don’t care” condition.
(4) “I”: stands for the increment operation, SDA held high during active SCL phase (high).
(5) “D”: stands for the decrement operation, SDA held low during active SCL phase (high).
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
S
T
O
P
HIGH-VOLTAGE
WRITE CYCLE
0 1 0 1A3A2A1A0 1000RBRA0 0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
S
T
O
P
HIGH-VOLTAGE
WRITE CYCLE
0 1 0 1A3A2A1A0 1110RBRA 0 P0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
S
T
O
P
0 1 0 1 A3 A2 A1 A0 1 1 0 1 RB RA 0 P0
S
T
A
R
T
Device Type
Identifier
Device
Addresses
S
A
C
K
Instruction
Opcode
DR/WCR
Addresses
S
A
C
K
Increment/Decrement
(Sent by Master on SDA)
S
T
O
P
0101A3A2A1A0 001000 0 P0 I/DI/D. . . .I/DI/D
X9268
15
FN8172.4
August 29, 2006
ABSOLUTE MAXIMUM RATINGS
Temperature under bias .................... -65°C to +135°C
Storage temperature ......................... -65°C to +150°C
Voltage on SDA, SCL or any address input
with respect to V
SS
................................. -1V to +7V
Voltage on V+ (referenced to V
SS
)........................ 10V
Voltage on V- (referenced to V
SS
)........................-10V
(V+) - (V-) ..............................................................12V
Any V
H
/R
H
..............................................................V+
Any V
L
/R
L
.................................................................V-
Lead temperature (soldering, 10s) .................. +300°C
I
W
(10s) ..............................................................±6mA
COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; the functional operation of
the device (at these or any other conditions above
those listed in the operational sections of this
specification) is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.
POTENTIOMETER CHARACTERISTICS (Over recommended operating conditions unless otherwise stated.)
Notes: (1) Absolute linearity is utilized to determine actual wiper voltage versus expected voltage as determined by wiper position when used as a
potentiometer.
(2) Relative linearity is utilized to determine the actual change in voltage between two successive tap positions when used as a
potentiometer. It is a measure of the error in step size.
(3) MI = RTOT / 255 or (R
H
- R
L
) / 255, single pot
(4) During power-up V
CC
> V
H
, V
L
, and V
W
.
(5) n = 0, 1, 2, …,255; m =0, 1, 2, …, 254.
RECOMMENDED OPERATING CONDITIONS
Temp Min. Max.
Commercial 0°C+70°C
Industrial -40°C+85°C
Device Supply Voltage (V
CC
)
(4)
Limits
X9268 5V ±10%
X9268-2.7 2.7V to 5.5V
V+ 2.7V to 5.5V
V- -2.7V to -5.5V
Symbol Parameter Test Conditions Min. Typ. Max. Unit
R
TOTAL
End to End Resistance T version 100 k
R
TOTAL
End to EndResistance U version 50 k
End to end resistance tolerance ±20 %
Power rating +25°C, each pot 50 mW
I
W
Wiper current ±3 mA
R
W
Wiper resistance I
W
= ± 1mA, V+ = 3V; V- = -3V 250
R
W
Wiper resistance I
W
= ± 1mA, V+ = 5V; V- = -5V 150
V+ Voltage on V+ Pin X9268 +4.5 +5.5 V
X9268-2.7 +2.7 +5.5
V- Voltage on V- Pin X9268 -5.5 -4.5 V
X9268 -2.7 -5.5 -2.7
V
TERM
Voltage on any V
H
/R
H
or V
L
/R
L
pin V- V+ V
Noise Ref: 1kHz -120 dBV
Resolution
(4)
0.4 %
Absolute linearity
(1)
V
w(n)(actual)
- V
w(n)(expected)
±1 MI
(3)
Relative linearity
(2)
V
w(n + 1)
- [V
w(n) + MI
0.6MI
(3)
Temperature coefficient of resistance ±300 ppm/°C
Ratiometric Temperature Coefficient ±20 ppm/°C
C
H
/C
L
/C
W
Potentiometer Capacitance See Circuit #3 10/10/25 pF
X9268

X9268TS24IZ-2.7T1

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Digital Potentiometer ICs DL DCP 100KOHM 256 TAPS 2-WIRE
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union