MCP9902/3/4
DS20005382C-page 12 2015-2016 Microchip Technology Inc.
For CPU substrate transistors that require the BJT
transistor model, the ideality factor behaves slightly
differently than for discrete diode-connected
transistors. Refer to Table 4-4 when using a CPU
substrate transistor.
4.11 Diode Faults
The MCP9902/3/4 detects several “diode fault” mech-
anisms, defined as one of the following: an open
between DP and DN, a short from V
DD
to DP, or a
short from V
DD
to DN. When each temperature mea-
surement is made, the device checks for a diode fault
on the external diode channel(s). When a diode fault is
detected, the ALERT
/THERM2 pin asserts (unless
masked, see Register 5-20) and the temperature data
reads 00h in the MSB and LSB registers (note: the low
limit will not be checked).
If a short occurs across DP and DN or a short occurs
from DP to GND, the low limit status bit is set and the
ALERT
/THERM2 pin asserts (unless masked). This
condition is indistinguishable from a temperature
measurement of 0.000°C (-64°C in extended range)
resulting in temperature data of 00h in the MSB and LSB
registers.
If a short from DN to GND occurs (with a diode-con-
nected transistor), temperature measurements will
continue as normal with no alerts.
The External Diode Fault Register (Register 5-19)
indicates which of the external diodes caused the
FAULT bit in the Status Register to be set. This
register is cleared when it is read.
4.12 Consecutive Alerts
The MCP9902/3/4 contains multiple consecutive alert
counters. One set of counters applies to the
ALERT/THERM2 pin and the second set of counters
applies to the THERM
pin. Each temperature measure-
ment channel has a separate consecutive alert counter
for each of the ALERT/THERM2 and THERM pins. All
counters are user programmable and determine the
number of consecutive measurements that a tempera-
ture channel(s) must be out-of-limit or reporting a diode
fault before the corresponding pin is asserted.
The Consecutive Alert register determines how many
times an out-of-limit error or diode fault must be
detected in consecutive measurements before the
ALERT
/THERM2 or THERM pin is asserted. Addition-
ally, the Consecutive Alert register controls the SMBus
Time-out functionality.
An out-of-limit condition (i.e., HIGH, LOW or FAULT)
occurring on the same temperature channel in consec-
utive measurements will increment the consecutive
alert counter. The counters will also be reset if no
out-of-limit condition or diode fault condition occurs in a
consecutive reading.
When the ALERT
/THERM2 pin is configured as an
interrupt, when the consecutive alert counter reaches
its programmed value, the following will occur: the
STATUS bit(s) for that channel and the last error
condition(s) (i.e., E1HIGH, or E2LOW and/or
TABLE 4-3: IDEALITY FACTOR LOOK-UP
TABLE (DIODE MODEL)
Setting Factor Setting Factor Setting Factor
08h 0.9949 18h 1.0159 28h 1.0371
09h 0.9962 19h 1.0172 29h 1.0384
0Ah 0.9975 1Ah 1.0185 2Ah 1.0397
0Bh 0.9988 1Bh 1.0200 2Bh 1.0410
0Ch 1.0001 1Ch 1.0212 2Ch 1.0423
0Dh 1.0014 1Dh 1.0226 2Dh 1.0436
0Eh 1.0027 1Eh 1.0239 2Eh 1.0449
0Fh 1.0040 1Fh 1.0253 2Fh 1.0462
10h 1.0053 20h 1.0267 30h 1.0475
11h 1.0066 21h 1.0280 31h 1.0488
12h 1.0080 22h 1.0293 32h 1.0501
13h 1.0093 23h 1.0306 33h 1.0514
14h 1.0106 24h 1.0319 34h 1.0527
15h 1.0119 25h 1.0332 35h 1.0540
16h 1.0133 26h 1.0345 36h 1.0553
17h 1.0146 27h 1.0358 37h 1.0566
TABLE 4-4: SUBSTRATE DIODE IDEALITY
FACTOR LOOK-UP TABLE
(BJT MODEL)
Setting Factor Setting Factor Setting Factor
08h 0.9869 18h 1.0079 28h 1.0291
09h 0.9882 19h 1.0092 29h 1.0304
0Ah 0.9895 1Ah 1.0105 2Ah 1.0317
0Bh 0.9908 1Bh 1.0120 2Bh 1.0330
0Ch 0.9921 1Ch 1.0132 2Ch 1.0343
0Dh 0.9934 1Dh 1.0146 2Dh 1.0356
0Eh 0.9947 1Eh 1.0159 2Eh 1.0369
0Fh 0.9960 1Fh 1.0173 2Fh 1.0382
10h 0.9973 20h 1.0187 30h 1.0395
11h 0.9986 21h 1.0200 31h 1.0408
12h 1.0000 22h 1.0213 32h 1.0421
13h 1.0013 23h 1.0226 33h 1.0434
14h 1.0026 24h 1.0239 34h 1.0447
15h 1.0039 25h 1.0252 35h 1.0460
16h 1.0053 26h 1.0265 36h 1.0473
17h 1.0066 27h 1.0278 37h 1.0486