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SST26VF016-80-5I-QAE-T

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P30P31-P33P34-P36P37-P39
©2011 Silicon Storage Technology, Inc. DS-25017A 04/11
34
Serial Quad I/O (SQI) Flash Memory
SST26VF016 / SST26VF032
Data Sheet
A
Microchip Technology Company
Figure 26:Serial Input Timing Diagram
Figure 27:Serial Output Timing Diagram
Table 16:Reset Timing Parameters
T
R(i)
Parameter Minimum Maximum Units
T
R(o)
Reset to Read (non-data operation) 10 ns
T
R(p)
Reset Recovery from Program or Suspend 100 µs
T
R(e)
Reset Recovery from Erase 1 ms
T16.0 25017
CE#
SIO
SCK
MSB
LSB
T
DS
T
DH
T
CHH
T
CES
T
CEH
T
CHS
T
SCKR
T
SCKF
T
CPH
1359 F24.0
1359 F25.0
CE#
SIO
SCK
MSB
T
CLZ
T
V
T
SCKH
T
CHZ
T
OH
T
SCKL
LSB
©2011 Silicon Storage Technology, Inc. DS-25017A 04/11
35
Serial Quad I/O (SQI) Flash Memory
SST26VF016 / SST26VF032
Data Sheet
A
Microchip Technology Company
Figure 28:Reset Timing Diagram
Figure 29:AC Input/Output Reference Waveforms
1359 F14.0
MODE 3
CLK
SIO(3:0)
CE#
MODE 3
C1 C3 C2C0
MODE 0
MODE 3
MODE 0MODE 0
T
CPH
Note: C[1:0] = 55H; C[3:2] = AAH
1359 F28.0
REFERENCE POINTS OUTPUTINPUT
V
HT
V
LT
V
HT
V
LT
V
IHT
V
ILT
AC test inputs are driven at V
IHT
(0.9V
DD
) for a logic ‘1’ and V
ILT
(0.1V
DD
) for a logic ‘0’.
Measurement reference points for inputs and outputs are V
HT
(0.6V
DD
) and V
LT
(0.4V
DD
). Input rise and fall times (10% 90%) are <3 ns.
Note: V
HT
-V
HIGH
Test
V
LT
-V
LOW
Test
V
IHT
-V
INPUT
HIGH
Test
©2011 Silicon Storage Technology, Inc. DS-25017A 04/11
36
Serial Quad I/O (SQI) Flash Memory
SST26VF016 / SST26VF032
Data Sheet
A
Microchip Technology Company
Product Ordering Information
Valid combinations for SST26VF016
SST26VF016-80-5I-QAE SST26VF016-80-5I-S2AE
Valid combinations for SST26VF032
SST26VF032-80-5I-QAE SST26VF032-80-5I-S2AE
Note: Valid combinations are those products in mass production or will be in mass production. Consult
your SST sales representative to confirm availability of valid combinations and to determine
availability of new combinations.
SST 26 VF 016 - 80 - 5I - S2AE
XX XX XXX - XX - XX
-
XXXX
Environmental Attribute
E
1
= non-Pb / non-Sn contact
(lead) finish
Package Modifier
A = 8 leads or contacts
Package Type
Q = WSON (6 mm x 5 mm)
S2 = SOIC (200 mil body width)
Temperature Range
I = Industrial = -40°C to +85°C
Minimum Endurance
5 = 100,000 cycles
Operating Frequency
80 = 80 MHz
Device Density
016 = 16 Mbit
032 = 32 Mbit
Voltage
V = 2.7-3.6V
Product Series
26 = Serial Quad I/O (SQI) Flash
Memory
1. Environmental suffix “E” denotes non-Pb sol-
der. SST non-Pb solder devices are “RoHS
Compliant”.
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P30P31-P33P34-P36P37-P39

SST26VF016-80-5I-QAE-T

Mfr. #:
Buy SST26VF016-80-5I-QAE-T
Manufacturer:
Microchip Technology
Description:
NOR Flash 2.7 to 3.6V 16Mbit Serial Quad I/O Flsh
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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