Si5017
Rev. 1.2 13
Lock Detect
The Si5017 provides lock-detect circuitry that indicates
whether the PLL has achieved frequency lock with the
incoming data. The operation of the lock-detector
depends on the reference clock option used.
When an external reference clock is provided, the circuit
compares the frequency of a divided-down version of
the recovered clock with the frequency of the applied
reference clock (REFCLK). If the recovered clock
frequency deviates from that of the reference clock by
the amount specified in Table 4 on page 9, the PLL is
declared out of lock, and the loss-of-lock (LOL
) pin is
asserted. In this state, the PLL will periodically try to
reacquire lock with the incoming data stream. During
reacquisition, the recovered clock frequency (CLKOUT)
drifts over a ±600 ppm range relative to the applied
reference clock and the LOL output alarm may toggle
until the PLL has reacquired frequency lock. Due to the
low noise and stability of the DSPLL, there is the
possibility that the PLL will not drift enough to render an
out-of-lock condition, even if the data is removed from
inputs.
In applications requiring a more stable output clock
during out-of-lock conditions, the lock-to-reference
(LTR
) input can be used to force the PLL to lock to the
externally supplied reference.
In the absence of an external reference, the lock detect
circuitry uses a data quality measure to determine when
frequency lock has been lost with the incoming data
stream. During reacquisition, CLKOUT may vary by
approximately ±10% from the nominal data rate.
Lock-to-Reference
The LTR input is used to force a stable output clock
when an alarm condition, like LOS, exists. In typical
applications, the LOS
output is tied to the LTR input to
force a stable output clock when the input data signal is
lost. When LTR
is asserted, the DSPLL is prevented
from acquiring the data signal present on DIN. The
operation of the LTR
control input depends on which
reference clocking mode is used.
When an external reference clock is present, assertion
of LTR
forces the DSPLL to lock CLKOUT to the
provided reference. If no external reference clock is
used, LTR
forces the DSPLL to hold the digital
frequency control input to the VCO at the last value.
This produces a stable output clock as long as supply
and temperature are constant.
Loss-of-Signal
The Si5017 indicates a loss-of-signal condition on the
LOS
output pin when the input peak-to-peak signal level
on DIN falls below an externally controlled threshold.
The LOS threshold range is specified in Table 3 and is
set by applying a voltage on the LOS_LVL pin. The
graph in Figure 6 illustrates the LOS_LVL mapping to
the LOS threshold. The LOS
output is asserted when
the input signal drops below the programmed peak-to-
peak value. If desired, the LOS
function may be
disabled by grounding LOS_LVL or by adjusting
LOS_LVL to be less than 1 V.
Figure 6. LOS_LVL Mapping
Figure 7. LOS Signal Hysteresis
Table 7. Typical REFCLK Frequencies
SONET/SDH
OC-48 with
15/14 FEC
Ratio of VCO
to REFCLK
19.44 MHz 20.83 MHz 128
77.76 MHz 83.31 MHz 32
155.52 MHz 166.63 MHz 16
40 mV/V
0 mV
0 V
LOS_LVL (V)
LOS Threshold (mV
PP
)
30 mV
2.25 V1.50 V1.00 V
15 mV
LOS Disabled
LOS
Undefined
1.875 V
40 mV
2.5 V
9
3
LOS
LOS_LVL
R1
R2 10k
Si5017
CDR
LOS Alarm
Set LOS
Level
Si5017
14 Rev. 1.2
In many applications it is desirable to produce a fixed
amount of signal hysteresis for an alarm indicator such
as LOS
, since a marginal data input signal could cause
intermittent toggling, leading to false alarm status.
When it is anticipated that very low-level DIN signals will
be encountered, the introduction of an adequate
amount of LOS hysteresis is recommended to minimize
any undesirable LOS signal toggling. Figure 7 illustrates
a simple circuit that may be used to set a fixed level of
LOS signal hysteresis for the Si5017 CDR. The value of
R1 may be chosen to provide a range of hysteresis from
3 to 8 dB where a nominal value of 800 adjusts the
hysteresis level to approximately 6 dB. Use a value of
500 or 1000 for R1 to provide 3 dB or 8 dB of
hysteresis, respectively.
Hysteresis is defined as the ratio of the LOS
deassert
level (LOSD) and the LOS
assert level (LOSA). The
hysteresis in decibels is calculated as 20log(LOSD/
LOSA).
Bit-Error-Rate (BER) Detection
The Si5017 uses a proprietary Silicon Laboratories®
algorithm to generate a bit-error-rate (BER) alarm on
the BER_ALM
pin if the observed BER is greater than a
user programmable threshold. Bit error detection relies
on the input data edge timing; edges occurring outside
of the expected event window are counted as bit errors.
The BER threshold is programmed by applying a
voltage to the BER_LVL pin between 500 mV and
2.25 V corresponding to a BER of approximately 10
–10
and 10
–6
, respectively. The voltage present on
BER_LVL maps to the BER as follows: log10(BER) =
(4 x BER_LVL) –13. (BER_LVL is in volts; BER is in bits
per second.)
Data Slicing Level
The Si5017 provides the ability to externally adjust the
slicing level for applications that require bit-error-rate
(BER) optimization. Adjustments in slicing level of
±15 mV (relative to the internally set input common
mode voltage) are supported. The slicing level is set by
applying a voltage between 0.75 and 2.25 V to the
SLICE_LVL input. The voltage present on SLICE_LVL
maps to the slicing level as follows:
where V
SLICE
is the slicing level, and V
SLICE_LVL
is the
voltage applied to the SLICE_LVL pin.
When SLICE_LVL is driven below 500 mV, the slicing
level adjustment is disabled, and the slicing level is set
to the cross-point of the differential input signal.
PLL Performance
The PLL implementation used in the Si5017 is fully
compliant with the jitter specifications proposed for
SONET/SDH equipment by Bellcore GR-253-CORE,
Issue 3, September 2000 and ITU-T G.958.
Jitter Tolerance
The Si5017’s tolerance to input jitter exceeds that of the
Bellcore/ITU mask shown in Figure 8. This mask
defines the level of peak-to-peak sinusoid jitter that
must be tolerated when applied to the differential data
input of the device.
Figure 8. Jitter Tolerance Specification
Jitter Transfer
The Si5017 exceeds all relevant Bellcore/ITU
specifications related to SONET/SDH jitter transfer.
Jitter transfer is defined as the ratio of output signal jitter
to input signal jitter as a function of jitter frequency.
These measurements are made with an input test signal
that is degraded with sinusoidal jitter whose magnitude
is defined by the mask in Figure 9.
V
SLICE
V
SLICE_LVL
1.5 V()
50
-------------------------------------------------------
=
15
1.5
0.15
f0 f1 f2 f3 ft
Sinusoidal
Input
Jitter (UI
PP
)
Frequency
Slope = 20 dB/Decade
F0
(Hz)
F1
(Hz)
F2
(kHz)
SONET
Data Rate
OC-48
F3
(kHz)
Ft
(kHz)
10 600 6 100 1000
Si5017
Rev. 1.2 15
Figure 9. Jitter Transfer Specification
Jitter Generation
The Si5017 exceeds all relevant specifications for jitter
generation proposed for SONET/SDH equipment. The
jitter generation specification defines the amount of jitter
that may be present on the recovered clock and data
outputs when a jitter free input signal is provided. The
Si5017 typically generates less than 3.0 mUI
rms
of jitter
when presented with jitter-free input data.
RESET/DSPLL Calibration
The Si5017 achieves optimal jitter performance by
automatically calibrating the loop gain parameters within
the DSPLL on powerup. Calibration may also be
initiated by a high-to-low transition on the RESET/CAL
pin. The RESET/CAL pin must be held high for at least
1
µs. When RESET/CAL is released (set to low) the
digital logic resets to a known initial condition,
recalibrates the DSPLL, and begins to lock to the
incoming data stream. For a valid reset to occur when
using Reference mode, a proper, external reference
clock frequency must be applied as specified in Table 7.
Clock Disable
The Si5017 provides a clock disable pin (CLK_DSBL)
that is used to disable the recovered clock output
(CLKOUT). When the CLK_DSBL pin is asserted, the
positive and negative terminals of CLKOUT are tied to
VDD through 100 on-chip resistors.
Data Squelch
The Si5017 provides a data squelching pin (DSQLCH)
that is used to set the recovered data output (DOUT) to
binary zero. When the DSQLCH pin is asserted, the
DOUT+ signal is held low and the DOUT– signal is held
high. This pin can be is used to squelch corrupt data
during LOS and LOL situations. Care must be taken
when ac coupling these outputs; a long string of zeros
or ones will not be held through ac coupling capacitors.
Device Grounding
The Si5017 uses the GND pad on the bottom of the 28-
pin micro leaded package (MLP) for device ground. This
pad should be connected directly to the analog supply
ground. See Figure 15 on page 19 and Figure 16 on
page 23 for the ground (GND) pad location.
Bias Generation Circuitry
The Si5017 makes use of an external resistor to set
internal bias currents. The external resistor allows
precise generation of bias currents which significantly
reduces power consumption versus traditional
implementations that use an internal resistor. The bias
generation circuitry requires a 10 k (1%) resistor
connected between REXT and GND.
Voltage Regulator
The Si5017 operates from a 3.3 V external supply
voltage. Internally the device operates from a 2.5 V
supply. The Si5017 regulates 2.5 V internally down from
the external 3.3 V supply.
In addition to supporting 3.3 V systems, the on-chip
linear regulator offers better power supply noise
rejection versus a direct 2.5 V supply.
Differential Input Circuitry
The Si5017 provides differential inputs for both the high-
speed data (DIN) and the reference clock (REFCLK)
inputs. An example termination for these inputs is
shown in Figures 10 and 11, respectively. In
applications where direct dc coupling is possible, the
0.1 µF capacitors may be omitted. (LOS operation is
only guaranteed when ac coupled.) The data input
limiting amplifier requires an input signal with a
differential peak-to-peak voltage as specified in Table 2
on page 7 to ensure a BER of at least 10
–12
. The
REFCLK input differential peak-to-peak voltage
requirement is also specified in Table 2.
0.1 dB
Jitter
Transfer
Fc
Frequency
20 dB/Decade
Slope
Fc
(kHz)
SONET
Data Rate
OC-48 2000
Acceptable
Range

SI5017-BM

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Silicon Labs
Description:
IC CLOCK/DATA RECOVERY 28MLP
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