MTFDDAK200MAN-1S1AA Datasheet MTFDDAK100MAN-1S1AA, MTFDDAK200MAN-1S1AA, MTFDDAK400MAN-1S1AA | P22-P24

Table 6: Supported ATA Command Set (Continued)

See ATA-8 standard for command details

Command Name Command Code (hex)

SECURITY FREEZE LOCK F5h

SECURITY SET PASSWORD F1h

SECURITY UNLOCK F2h

SEEK 70h

SET FEATURES EFh

SET MAX ADDRESS F9h

SET MAX ADDRESS EXT 37h

SET MULTIPLE MODE C6h

SLEEP E6h or 99h

SMART DISABLE OPERATIONS B0h/D9h

SMART ENABLE OPERATIONS B0h/D8h

SMART ENABLE/DISABLE AUTOSAVE B0h/D2h

SMART EXECUTE OFF-LINE IMMEDIATE B0h/D4h

SMART READ DATA B0h/D0h

SMART READ LOG B0h/D5h

SMART RETURN STATUS B0h/DAh

SMART WRITE LOG B0h/D6h

STANDBY E2h or 96h

STANDBY IMMEDIATE E0h or 94h

WRITE BUFFER E8h

WRITE DMA (with retry) CAh

WRITE DMA (without retry) CBh

WRITE DMA EXT 35h

WRITE DMA FUA EXT 3Dh

WRITE FPDMA QUEUED 61h

WRITE LOG EXT 3Fh

WRITE LOG DMA EXT 57h

WRITE MULTIPLE C5h

WRITE MULTIPLE EXT 39h

WRITE MULTIPLE FUA EXT CEh

WRITE SECTOR(S) (with retry) 30h

WRITE SECTOR(S) EXT 34h

WRITE UNCORRECTABLE EXT 45h

P400m 2.5-Inch NAND Flash SSD

Commands

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p400m_2_5.pdf - Rev. H 11/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Performance

Measured performance can vary for a number of reasons. The major factors affecting

drive performance are the density of the drive and the interface of the host. Additional-

ly, overall system performance can affect the measured drive performance. When com-

paring drives, it is recommended that all system variables are the same, and only the

drive being tested varies.

Performance numbers will vary depending on the host system configuration.

Table 7: Drive Performance

Density 100GB 200GB 400GB Unit

Sequential read (64KB transfer) 380 380 380 MB/s

Sequential write (64KB transfer) 200 310 310 MB/s

Random read (4KB transfer) 52,000 54,000 60,000 IOPS

Random write (4KB transfer) 21,000 26,000 26,000 IOPS

READ latency (TYP) 0.57 0.51 0.51 ms

WRITE latency (TYP) 2 2 2 ms

Notes:

1. Typical I/O performance numbers as measured using Iometer with a queue depth of 32

and write cache disabled.

2. Iometer measurements are performed in the steady state region.

3. 4KB transfers used for READ/WRITE latency values.

4. System variations may affect measured results.

Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 8: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

<1 sector per 10

bits READ

Mean Time to Failure

Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-

ability data using the methods referenced in the Telcordia SR-332 reliability prediction

procedures for electronic equipment.

Table 9: MTTF

Density MTTF (Operating Hours)

100GB 2 million

P400m 2.5-Inch NAND Flash SSD

Performance

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p400m_2_5.pdf - Rev. H 11/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Table 9: MTTF (Continued)

Density MTTF (Operating Hours)

200GB 2 million

400GB 2 million

Note:

1. The product achieves a MTTF of 2 million hours based on population statistics not rele-

vant to individual units.

Endurance

Endurance for the SSD can be predicted based on the usage conditions applied to the

device, the internal NAND component cycles, the write amplification factor, and the

wear-leveling efficiency of the drive. Total bytes written measured with 55°C case tem-

perature within the total bytes written values listed in this document. The table below

shows the drive lifetime for each SSD density based on predefined usage conditions.

Table 10: Drive Lifetime

Density Drive Lifetime (Total Bytes Written)

100GB 1.75PB

200GB 3.5PB

400GB 7PB

Notes:

1. Total bytes written calculated with the drive 90% full.

2. Access patterns are 50% sequential and 50% random and consist of the following: 5%

are 4KB; 5% are 8KB; 10% are 16KB; 10% are 32KB; 35% are 64KB; and 35% are 128KB.

P400m 2.5-Inch NAND Flash SSD

Reliability

PDF: 09005aef84952553

p400m_2_5.pdf - Rev. H 11/13 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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MTFDDAK200MAN-1S1AA

Mfr. #:

Buy MTFDDAK200MAN-1S1AA

Manufacturer:

Micron

Description:

SSD 200GB 2.5" MLC SATA III 5V

Lifecycle:

New from this manufacturer.

Delivery:

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MTFDDAK200MAN-1S1AA

MTFDDAK200MAN-1S1AA

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