34
4234G–SCR–01/07
AT83C24
Table 25. Smart Card RST (CRST pin)
Symbol Parameter Min Typ Max Unit Test Conditions
V
OL
Output Low-voltage
0
0
0.12 x CVCC
0.4
0.2
V
I
OL
= -20 µA CLASS
A&B&C
I
OL
= -200 µA CLASS A
I
OL
= -200 µA CLASS
B&C
V
OH
Output High Voltage 0.9*CVCC CVCC V
I
OH
= 200 µA
CLASS A&B&C
I
OS
Output High Current -15 +15 mA Short to GND or CVCC
t
R
t
F
Rise and Fall time 0.1 µs
C
L
= 30pF
measurement between
10% and 90% of CVCC
Low level voltage stability
(taking into account PCB design)
-0.25
0.50V
0.30V
0.30V
V
CLASS A
CLASS B
CLASS C
High level voltage stability
(taking into account PCB design)
4.2
2.35
CVCC-0.4
CVCC+0.25 V
CLASS A
CLASS B
CLASS C
Table 26. Card Presence
Symbol Parameter Min Typ Max Unit Test Conditions
R
CPRES
CPRES weak pull-up output current 300 330 360 κΩ
Short to VSS
PULLUP = 1:
Internal pull-up active
Table 27. TWI (SDA, SCL pins)
Symbol Parameter Min Typ Max Unit Test Conditions
t
SU;DAT
Data set-up time 20 10 ns Not tested
t
HD;DAT
Data hold time 10 0 ns Not tested
t
fDA
Fall time on SDA signal 50 ns Not tested
