Philips Semiconductors Product specification
P83C557E4/P80C557E4/P89C557E4Single-chip 8-bit microcontroller
1999 Mar 02
64
1
0
2
3
4
5
6
7
1018
1019
1020
1021
1022
1023
1 2 3 4 5 6 7 1018 1019 1020 1021 1022 1023 1024
Code
Out
(2)
(1)
(5)
(4)
(3)
1 LSB
(ideal)
Offset
error
OS
e
Offset
error
OS
e
Gain
error
G
e
AV
IN
(LSB
ideal
)
1 LSB =
AV
REF+
AV
REF–
1024
(1) Example of an actual transfer curve.
(2) The ideal transfer curve.
(3) Differential non-linearity (DL
e
).
(4) Integral non-linearity (IL
e
).
(5) Center of a step of the actual transfer curve.
Figure 56. ADC Conversion Characteristic
Philips Semiconductors Product specification
P83C557E4/P80C557E4/P89C557E4Single-chip 8-bit microcontroller
1999 Mar 02
65
11. AC CHARACTERISTICS
AC ELECTRICAL CHARACTERISTICS
V
DD
= 5 V ± 10% (EBx), V
SS
= 0 V, t
CLK
min = 1/fmax (maximum operating frequency)
V
DD
= 5 V ± 10% (EFx), V
SS
= 0 V, t
CLK
min = 1/fmax (maximum operating frequency)
T
amb
= 0 °C to +70 °C, t
CLK
min = 63 ns for P8xC557E4EBx
T
amb
= –40 °C to +85 °C, t
CLK
min = 63 ns for P8xC557E4EFx
C1 = 100 pF for Port 0, ALE and PSEN
; C1 = 80 pF for all other outputs unless otherwise specified.
12MHz CLOCK 16MHz CLOCK VARIABLE CLOCK
SYMBOL FIGURE PARAMETER MIN MAX MIN MAX MIN MAX UNIT
1/t
CLK
60 System clock frequency 3.5 16 MHz
t
LHLL
60 ALE pulse width 127 85 2t
CLK
–40 ns
t
AVLL
60 Address valid to ALE LOW 43 23 t
CLK
–40 ns
t
LLAX
60 Address hold after ALE LOW 53 33 t
CLK
–30 ns
t
LLIV
60 ALE LOW to valid instruction in 234 150 4t
CLK
–100 ns
t
LLPL
60 ALE LOW to PSEN LOW 53 33 t
CLK
–30 ns
t
PLPH
60 PSEN pulse width 205 143 3t
CLK
–45 ns
t
PLIV
60 PSEN LOW to valid instruction in 145 83 3t
CLK
–105 ns
t
PXIX
60 Input instruction hold after PSEN 0 0 0 ns
t
PXIZ
60 Input instruction float after PSEN 59 38 t
CLK
–25 ns
t
AVIV
60 Address to valid instruction in 312 208 5t
CLK
–105 ns
t
PLAZ
60 PSEN LOW to address float 10 10 10 ns
Data Memory
t
AVLL
61, 62 Address valid to ALE LOW 43 23 t
CLK
–40 ns
t
LLAX
61, 62 Address hold after ALE LOW 48 28 t
CLK
–35 ns
t
RLRH
61 RD pulse width 400 275 6t
CLK
–100 ns
t
WLWH
62 WR pulse width 400 275 6t
CLK
–100 ns
t
RLDV
61 RD LOW to valid data in 252 148 5t
CLK
–165 ns
t
RHDX
61 Data hold after RD 0 0 0 ns
t
RHDZ
61 Data float after RD 97 55 2t
CLK
–70 ns
t
LLDV
61 ALE LOW to valid data in 517 350 8t
CLK
–150 ns
t
AVDV
61 Address to valid data in 585 398 9t
CLK
–165 ns
t
LLWL
61, 62 ALE LOW to RD or WR LOW 200 300 138 238 3t
CLK
–50 3t
CLK
+50 ns
t
AVWL
61, 62 Address valid to WR LOW or RD LOW 203 120 4t
CLK
–130 ns
t
QVWX
62 Data valid to WR transition 33 13 t
CLK
–50 ns
t
QVWH
62 Data before WR 433 288 7t
CLK
–150 ns
t
WHQX
62 Data hold after WR 33 13 t
CLK
–50 ns
t
RLAZ
61 RD low to address float 0 0 0 ns
t
WHLH
61, 62 RD or WR HIGH to ALE HIGH 43 123 23 103 t
CLK
–40 t
CLK
+40 ns
UART Timing – Shift Register Mode (Test Conditions: T
amb
= 0 °C to +70 °C; V
SS
= 0 V; Load Capacitance = 80pF)
t
XLXL
64 Serial port clock cycle time 1.0 0.75 12t
CLK
µs
t
QVXH
64 Output data setup to clock rising edge 700 492 10t
CLK
–133 ns
t
XHQX
64 Output data hold after clock rising edge 50 8 2t
CLK
–117 ns
t
XHDX
64 Input data hold after clock rising edge 0 0 0 ns
t
XHDV
64 Clock rising edge to input data valid 700 492 10t
CLK
–133 ns
Philips Semiconductors Product specification
P83C557E4/P80C557E4/P89C557E4Single-chip 8-bit microcontroller
1999 Mar 02
66
AC ELECTRICAL CHARACTERISTICS (Continued)
SYMBOL PARAMETER
Standard-mode
I
2
C-bus
Fast-mode
I
2
C-bus UNIT
MIN MAX MIN MAX
I
2
C Interface timing (refer to Figure 63)
f
SCL
SCL clock frequency 0 100 0 400 kHz
t
BUF
Bus free time between a STOP and START condition 4.7 1.3 µs
t
HD;
STA
Hold time (repeated) START condition. After this period, the
first clock pulse is generated
4.0 0.6 µs
t
LOW
LOW period of the SCL clock 4.7 1.3 µs
t
HIGH
High period of the SCL clock 4.0 0.6 µs
t
SU;
STA
Set-up time for a repeated START condition 4.7 0.6 µs
t
HD;
DAT
Data hold time:
for CBUS competible masters (see Section 9, Notes 1, 3)
for I
2
C-bus devices
5.0
0
1
0
1
0.9
2
µs
t
SU;
DAT
Data set-up time 250 100
3
ns
t
FD
, t
FC
Rise time of both SDA and SCL signals 1000 20 +
0.1C
b
4
300 ns
t
FD
, t
FC
Fall time of both SDA and SCL signals 300 20 +
0.1C
b
4
300 ns
t
SU
;
STO
Set-up time for STOP condition 4.0 0.6 µs
C
b
Capacitive load for each bus line 400 400 pF
t
SP
Pulse width of spikes which must be suppressed by the input
filter
0 50 ns
All values referred to V
IH
and V
IL
max
levels.
NOTES:
1. A device must internally provide a hold time of at least 300 ns from the SDA signal (referred to the V
IH
min
of the SCL signal) in order to
bridge the undefined region of the falling edge of SCL.
2. The maximum t
HD,DAT
has only to be met if the device does not stretch the LOW period (t
LOW
) of the SCL signal.
3. A fast-mode I
2
C-bus device can be used in a standard-mode I
2
C-bus system, but the requirement t
SU,DAT
> 250 ns must then be met. This
will automatically be the case if the device does not stretch the LOW period of the SCL signal. If such a device does stretch the LOW period
of the SCL signal, it must output the next data bit to the SDA line t
Rmax
+ t
SU,DAT
= 1000 + 250 = 1250 ns (according to the standard-mode
I
2
C-bus specification) before the SCL line is released.
4. C
b
= total capacitance of one bus line in pF.
Table 46. External clock drive XTAL1 (refer to Figure 57)
SYMBOL PARAMETER
VARIABLE CLOCK
f
CLK
= 3.5 to 16 MHz UNIT
MIN MAX
t
CLK
XTAL1 Period 63 286 ns
t
CLKH
XTAL1 HIGH time 20 ns
t
CLKL
XTAL1 LOW time 20 ns
t
CLKR
XTAL1 rise time 20 ns
t
CLKF
XTAL1 fall time 20 ns
t
CYC
1)
Controller cycle time 0.75 3.4 µs
NOTE:
1. t
CYC
= 12 f
CLK

P80C557E4EFB/01,55

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
IC MCU 8BIT ROMLESS 80QFP
Lifecycle:
New from this manufacturer.
Delivery:
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