40
COMMERCIAL AND INDUSTRIAL
TEMPERATURE RANGES
IDT72T3645/55/65/75/85/95/105/115/125 2.5V TeraSync
36-BIT FIFO
1K x 36, 2K x 36, 4K x 36, 8K x 36, 16K x 36, 32K x 36, 64K x 36, 128K x 36 and 256K x 36
FEBRUARY 4, 2009
Figure 14. Write Timing (First Word Fall Through Mode)
NOTES:
1. t
SKEW1 is the minimum time between a rising WCLK edge and a rising RCLK edge to guarantee that OR will go LOW after two RCLK cycles plus tREF. If the time between the rising edge of WCLK and the rising edge of RCLK
is less than t
SKEW1, then OR assertion may be delayed one extra RCLK cycle.
2. t
SKEW2 is the minimum time between a rising WCLK edge and a rising RCLK edge to guarantee that PAE will go HIGH after one RCLK cycle plus tPAES. If the time between the rising edge of WCLK and the rising edge of RCLK
is less than t
SKEW2, then the PAE deassertion may be delayed one extra RCLK cycle.
3. LD = HIGH, OE = LOW
4. n = PAE offset, m = PAF offset and D = maximum FIFO depth.
5. D = 1,025 for IDT72T3645, 2,049 for IDT72T3655, 4,097 for IDT72T3665, 8,193 for IDT72T3675, 16,385 for IDT72T3685, 32,769 for the IDT72T3695, 65,537 for the IDT72T36105, 131,073 for the IDT72T36115 and 262,145 for
the IDT72T36125.
6. First data word latency = t
SKEW1 + 2*TRCLK + tREF.
W
1
W
2
W
4
W
[n +2]
W
[D-m-1]
W
[D-m-2]
W
[D-1]
W
D
W
[n+3]
W
[n+4]
W
[D-m]
W
[D-m+1]
WCLK
WEN
D0 - Dn
RCLK
t
DH
t
DS
t
SKEW1
(1)
REN
Q0 - Qn
PAF
HF
PAE
IR
t
DS
t
DS
t
DS
t
SKEW2
t
A
t
REF
OR
t
PAES
t
HF
t
PAFS
t
WFF
W
[D-m+2]
W
1
t
ENH
5907 drw 19
PREVIOUS DATA IN OUTPUT REGISTER
(2)
W
3
1
2
3
1
D-1
][
W
D-1
][
W
D-1
][
W
1
2
t
ENS
RCS
t
RCSLZ
t
ENS
41
COMMERCIAL AND INDUSTRIAL
TEMPERATURE RANGES
IDT72T3645/55/65/75/85/95/105/115/125 2.5V TeraSync
36-BIT FIFO
1K x 36, 2K x 36, 4K x 36, 8K x 36, 16K x 36, 32K x 36, 64K x 36, 128K x 36 and 256K x 36
FEBRUARY 4, 2009
Figure 15. Read Timing (First Word Fall Through Mode)
WCLK
12
WEN
D0 - Dn
RCLK
t
ENS
REN
Q0 - Qn
PAF
HF
PAE
IR
OR
W
1
W
1
W
2
W
3
W
m+2
W
[m+3]
t
OHZ
t
SKEW1
t
ENH
t
DS
t
DH
t
OE
t
A
t
A
t
A
t
PAFS
t
WFF
t
WFF
t
ENS
OE
t
SKEW2
W
D
5907 drw20
t
PAES
W
[D-n]
W
[D-n-1]
t
A
t
A
t
HF
t
REF
W
[D-1]
W
D
t
A
W
[D-n+1]
W
[m+4]
W
[D-n+2]
(1)
(2)
t
ENS
D-1
][
W
D-1
][
W
1
NOTES:
1. t
SKEW1 is the minimum time between a rising RCLK edge and a rising WCLK edge to guarantee that IR will go LOW after one WCLK cycle plus tWFF. If the time between the rising edge of RCLK and the rising edge of WCLK
is less than t
SKEW1, then the IR assertion may be delayed one extra WCLK cycle.
2. t
SKEW2 is the minimum time between a rising RCLK edge and a rising WCLK edge to guarantee that PAF will go HIGH after one WCLK cycle plus tPAFS. If the time between the rising edge of RCLK and the rising edge of WCLK
is less than t
SKEW2, then the PAF deassertion may be delayed one extra WCLK cycle.
3. LD = HIGH.
4. n = PAE Offset, m = PAF offset and D = maximum FIFO depth.
5. D = 1,025 for IDT72T3645, 2,049 for IDT72T3655, 4,097 for IDT72T3665, 8,193 for IDT72T3675, 16,385 for IDT72T3685, 32,769 for the IDT72T3695, 65,537 for the IDT72T36105, 131,073 for the IDT72T36115 and 262,145 for
the IDT72T36125.
6. RCS = LOW.
42
COMMERCIAL AND INDUSTRIAL
TEMPERATURE RANGES
IDT72T3645/55/65/75/85/95/105/115/125 2.5V TeraSync
36-BIT FIFO
1K x 36, 2K x 36, 4K x 36, 8K x 36, 16K x 36, 32K x 36, 64K x 36, 128K x 36 and 256K x 36
FEBRUARY 4, 2009
Figure 16. Read Cycle and Read Chip Select Timing (First Word Fall Through Mode)
WCLK
12
WEN
D0 - Dn
RCLK
REN
Q0 - Qn
PAF
HF
PAE
IR
OR
W
1
W
2
W
3
W
m+2
W
[m+3]
t
RCSHZ
t
SKEW1
t
ENH
t
DS
t
DH
t
A
t
A
t
PAFS
t
WFF
t
WFF
t
ENS
RCS
t
SKEW2
W
D
5907 drw21
t
PAES
W
[D-n]
W
[D-n-1]
t
A
t
A
W
[D-1]
W
D
t
A
W
[D-n+1]
W
[m+4]
W
[D-n+2]
(1)
(2)
t
ENS
1
t
ENS
t
RCSLZ
t
ENS
t
HF
t
REF
D-1
][
W
D-1
][
W
t
ENH
NOTES:
1. t
SKEW1 is the minimum time between a rising RCLK edge and a rising WCLK edge to guarantee that IR will go LOW after one WCLK cycle plus tWFF. If the time between the rising edge of RCLK and the rising edge of WCLK
is less than t
SKEW1, then the IR assertion may be delayed one extra WCLK cycle.
2. t
SKEW2 is the minimum time between a rising RCLK edge and a rising WCLK edge to guarantee that PAF will go HIGH after one WCLK cycle plus tPAFS. If the time between the rising edge of RCLK and the rising edge of WCLK
is less than t
SKEW2, then the PAF deassertion may be delayed one extra WCLK cycle.
3. LD = HIGH.
4. n = PAE Offset, m = PAF offset and D = maximum FIFO depth.
5. D = 1,025 for IDT72T3645, 2,049 for IDT72T3655, 4,097 for IDT72T3665, 8,193 for IDT72T3675, 16,385 for IDT72T3685, 32,769 for the IDT72T3695, 65,537 for the IDT72T36105, 131,073 for the IDT72T36115 and 262,145 for
the IDT72T36125.
6. OE = LOW.

72T3695L5BB

Mfr. #:
Manufacturer:
IDT
Description:
FIFO 2.5V 32K X 36 FIFO
Lifecycle:
New from this manufacturer.
Delivery:
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