Lattice Semiconductor LA-ispMACH 4000V/Z Automotive Family Data Sheet
22
t
BSR
GLB PT Set/Reset Delay 1.83 1.83 ns
t
PTSR
Macrocell PT Set/Reset Delay 3.41 2.72 ns
t
GPTOE
Global PT OE Delay 5.58 3.50 ns
t
PTOE
Macrocell PT OE Delay 4.28 2.00 ns
Timing v.3.2
Note: Internal Timing Parameters are not tested and are for reference only. Refer to the Timing Model in this data sheet for further details.
LA-ispMACH 4000V/Z Internal Timing Parameters (Cont.)
Over Recommended Operating Conditions
Parameter Description
LA-ispMACH 4000V
-75
LA-ispMACH 4000Z
-75
UnitsMin. Max. Min. Max.
Lattice Semiconductor LA-ispMACH 4000V/Z Automotive Family Data Sheet
23
LA-ispMACH 4000V/Z Timing Adders
1
Adder Type Base Parameter Description
LA-ispMACH 4000V
-75
LA-ispMACH 4000Z
-75
UnitsMin. Max. Min. Max.
Optional Delay Adders
t
INDIO
t
INREG
Input register delay 1.00 1.30 ns
t
EXP
t
MCELL
Product term expander delay 0.33 0.50 ns
t
ORP
Output routing pool delay 0.05 0.40 ns
t
BLA
t
ROUTE
Additional block loading adder 0.05 0.05 ns
t
IOI
Input Adjusters
LVTTL_in t
IN
, t
GCLK_IN
, t
GOE
Using LVTTL standard 0.60 0.60 ns
LVCMOS33_in t
IN
, t
GCLK_IN
, t
GOE
Using LVCMOS 3.3 standard 0.60 0.60 ns
LVCMOS25_in t
IN
, t
GCLK_IN
, t
GOE
Using LVCMOS 2.5 standard 0.60 0.60 ns
LVCMOS18_in t
IN
, t
GCLK_IN
, t
GOE
Using LVCMOS 1.8 standard 0.00 0.00 ns
PCI_in t
IN
, t
GCLK_IN
, t
GOE
Using PCI compatible input 0.60 0.60 ns
t
IOO
Output Adjusters
LVTTL_out t
BUF
, t
EN
, t
DIS
Output configured as TTL buffer 0.20 0.20 ns
LVCMOS33_out t
BUF
, t
EN
, t
DIS
Output configured as 3.3V buffer 0.20 0.20 ns
LVCMOS25_out t
BUF
, t
EN
, t
DIS
Output configured as 2.5V buffer 0.10 0.10 ns
LVCMOS18_out t
BUF
, t
EN
, t
DIS
Output configured as 1.8V buffer 0.00 0.00 ns
PCI_out t
BUF
, t
EN
, t
DIS
Output configured as PCI
compatible buffer
0.20 0.20 ns
Slow Slew t
BUF
, t
EN
Output configured for slow slew
rate
1.00 1.00 ns
Note: Open drain timing is the same as corresponding LVCMOS timing. Timing v.3.2
1. Refer to TN1004, ispMACH 4000 Timing Model Design and Usage Guidelines for information regarding use of these adders.
Lattice Semiconductor LA-ispMACH 4000V/Z Automotive Family Data Sheet
24
Boundary Scan Waveforms and Timing Specifications
Symbol Parameter Min. Max. Units
t
BTCP
TCK [BSCAN test] clock cycle 40 ns
t
BTCH
TCK [BSCAN test] pulse width high 20 ns
t
BTCL
TCK [BSCAN test] pulse width low 20 ns
t
BTSU
TCK [BSCAN test] setup time 8 ns
t
BTH
TCK [BSCAN test] hold time 10 ns
t
BRF
TCK [BSCAN test] rise and fall time 50 mV/ns
t
BTCO
TAP controller falling edge of clock to valid output 10 ns
t
BTOZ
TAP controller falling edge of clock to data output disable 10 ns
t
BTVO
TAP controller falling edge of clock to data output enable 10 ns
t
BTCPSU
BSCAN test Capture register setup time 8 ns
t
BTCPH
BSCAN test Capture register hold time 10 ns
t
BTUCO
BSCAN test Update reg, falling edge of clock to valid output 25 ns
t
BTUOZ
BSCAN test Update reg, falling edge of clock to output disable 25 ns
t
BTUOV
BSCAN test Update reg, falling edge of clock to output enable 25 ns

LA4032ZC-75TN48E

Mfr. #:
Manufacturer:
Lattice
Description:
CPLD - Complex Programmable Logic Devices Auto Grade (AEC-Q100 ) ispMACH4032Z
Lifecycle:
New from this manufacturer.
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