Si5010
Rev. 1.4 7
Table 3. AC Characteristics (Clock & Data)
(V
A
2.5 V ±5%, T
A
= –40 to 85 °C)
Parameter Symbol Test Condition Min Typ Max Unit
Output Clock Rate f
CLK
150 666 MHz
Output Rise/Fall Time
(differential) t
R,
t
F
Figure 3 80 110 ps
Clock to Data Delay
OC-12
OC-3
t
(c-d)
Figure 2
835
4040
880
4090
930
4140
ps
ps
Input Return Loss 100 kHz–1 GHz 20 dB
Table 4. AC Characteristics (PLL Characteristics)
(V
DD
=2.5V ±5%, T
A
= –40 to 85 °C)
Parameter Symbol Test Condition Min Typ Max Unit
Jitter Tolerance (OC-12 Mode)
*
J
TOL(PP)
f = 30 Hz 40 UI
PP
f = 300 Hz 4 UI
PP
f=25 kHz 4 UI
PP
f = 250 kHz 0.4 UI
PP
Jitter Tolerance (OC-3 Mode)
*
J
TOL(PP)
f = 30 Hz 40 UI
PP
f = 300 Hz 4 UI
PP
f = 6.5 kHz 4 UI
PP
f=65 kHz 0.4 UI
PP
RMS Jitter Generation
*
J
GEN(rms)
with no jitter on serial data 1.6 3.0 mUI
Peak-to-Peak Jitter Generation J
GEN(PP)
with no jitter on serial data 25 55 mUI
Jitter Transfer Bandwidth
*
J
BW
OC-12 Mode 500 kHz
OC-3 Mode 130 kHz
Jitter Transfer Peaking
*
J
P
f < 2 MHz .03 0.1 dB
Acquisition Time T
AQ
After falling edge of
PWRDN/CAL
1.45 1.5 1.7 ms
From the return of valid
data
40 60 150 μs
Input Reference Clock Duty Cycle C
DUTY
40 50 60 %
Reference Clock Range 19.44 155.52 MHz
Input Reference Clock Frequency
Tolerance
C
TOL
–100 100 ppm
Frequency Difference at which
Receive PLL goes out of Lock
(REFCLK compared to the divided
down VCO clock)
LOL 450 600 750 ppm
Frequency Difference at which
Receive PLL goes into Lock
(REFCLK compared to the divided
down VCO clock)
LOCK 150 300 450 ppm
*Note: Bellcore specifications: GR-253-CORE, Issue 3, September 2000. Using PRBS 2
23
–1 data pattern.
Si5010
8 Rev. 1.4
Table 5. Absolute Maximum Ratings
Parameter Symbol Value Unit
DC Supply Voltage V
DD
–0.5 to 2.8 V
LVTTL Input Voltage V
DIG
–0.3 to 3.6 V
Differential Input Voltages V
DIF
–0.3 to (V
DD
+ 0.3) V
Maximum Current any output PIN ±50 mA
Operating Junction Temperature T
JCT
–55 to 150 °C
Storage Temperature Range T
STG
–55 to 150 °C
ESD HBM Tolerance (100 pf, 1.5 kΩ)1kV
Note: Permanent device damage may occur if the above absolute maximum ratings are exceeded. Functional operation
should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Table 6. Thermal Characteristics
Parameter Symbol Test Condition Value Unit
Thermal Resistance Junction to Ambient ϕ
JA
Still Air 38 °C/W
Si5010
Rev. 1.4 9
3. Typical Application Schematic
Si5010
LVTTL
Control Inputs
Loss-of-Lock
Indicator
LOL
High-Speed
Serial Input
System
Reference
Clock
DIN+
DIN–
REFCLK+
REFCLK–
REXT
VDD
GND
DOUT+
DOUT–
CLKOUT+
CLKOUT–
Recovered
Data
Recovered
Clock
0.1 μF
2200 pF
VDD
10 kΩ
(1%)
RATESEL1-0
PWRDN/CAL
2
20 pF

SI5010-B-GMR

Mfr. #:
Manufacturer:
Silicon Labs
Description:
IC CLOCK/DATA RECOVERY LP 20-QFN
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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