22
COMMERCIAL TEMPERATURE RANGE
IDT72V7230/7240/7250/7260/7270/7280/7290/72100 3.3V HIGH DENSITY SUPERSYNC II
TM
FIFO
512 x 72, 1K x 72, 2K x 72, 4K x 72, 8K x 36, 16K x 72, 32K x 72, 64K x 72
t
TCK
t
4
t
2
t
3
t
1
t
DS
t
DH
TDO
TDO
TDI/
TMS
TCK
TRST
t
5
t
DO
Notes to diagram:
t1 =
t
TCKLOW
t2 =
t
TCKHIGH
t3 =
t
TCKFALL
t4 = t
TCKRise
t5 =
tRST
(reset pulse width)
t6 = tRSR (reset recovery)
4680 drw10
t
6
Figure 5. Standard JTAG Timing
SYSTEM INTERFACE PARAMETERS
Parameter Symbol Test
Conditions
Min. Max. Units
JTAG Clock Input Period tTCK - 100 - ns
JTAG Clock HIGH tTCKHIGH -40-ns
JTAG Clock Low tTCKLOW -40-ns
JTAG Clock Rise Time tTCKRise --5
(1)
ns
JTAG Clock Fall Time tTCKFall --5
(1)
ns
JTAG Reset tRST -50-ns
JTAG Reset Recovery tRSR -50-ns
JTAG AC ELECTRICAL
CHARACTERISTICS
(vcc = 3.3V ± 5%; Tcase = 0°C to +85°C)
IDT72V7230
IDT72V7240
IDT72V7250
IDT72V7260
IDT72V7270
IDT72V7280
IDT72V7290
IDT72V72100
Parameter Symbol Test Conditions Min. Max. Units
Data Output t
DO = Max 20 ns
Data Output Hold tDOH
(1)
0–ns
Data Input tDS trise=3ns 10 ns
tDH tfall=3ns 10
NOTE:
1. 50pf loading on external output signals.
JTAG TIMING SPECIFICATION
NOTE:
1. Guaranteed by design.
23
COMMERCIAL TEMPERATURE RANGE
IDT72V7230/7240/7250/7260/7270/7280/7290/72100 3.3V HIGH DENSITY SUPERSYNC II
TM
FIFO
512 x 72, 1K x 72, 2K x 72, 4K x 72, 8K x 36, 16K x 72, 32K x 72, 64K x 72
JTAG INTERFACE
Five additional pins (TDI, TDO, TMS, TCK and TRST) are provided to
support the JTAG boundary scan interface. The IDT72V7230/72V7240/
72V7250/72V7260/72V7270/72V7280/72V7290/72V72100 incorporates
the necessary tap controller and modified pad cells to implement the JTAG facility.
Note that IDT provides appropriate Boundary Scan Description Language
program files for these devices.
The Standard JTAG interface consists of four basic elements:
Test Access Port (TAP)
TAP controller
Instruction Register (IR)
Data Register Port (DR)
The following sections provide a brief description of each element. For a
complete description refer to the IEEE Standard Test Access Port Specification
(IEEE Std. 1149.1-1990).
The Figure below shows the standard Boundary-Scan Architecture
T
A
P
TAP
Cont-
roller
Mux
DeviceID Reg.
Boundary Scan Reg.
Bypass Reg.
clkDR, ShiftDR
UpdateDR
TDO
TDI
TMS
TCLK
TRST
clklR, ShiftlR
UpdatelR
Instruction Register
Instruction Decode
Control Signals
4680 drw11
Figure 6. Boundary Scan Architecture
TEST ACCESS PORT (TAP)
The Tap interface is a general-purpose port that provides access to the
internal of the processor. It consists of four input ports (TCLK, TMS, TDI, TRST)
and one output port (TDO).
THE TAP CONTROLLER
The Tap controller is a synchronous finite state machine that responds to
TMS and TCLK signals to generate clock and control signals to the Instruction
and Data Registers for capture and update of data.
24
COMMERCIAL TEMPERATURE RANGE
IDT72V7230/7240/7250/7260/7270/7280/7290/72100 3.3V HIGH DENSITY SUPERSYNC II
TM
FIFO
512 x 72, 1K x 72, 2K x 72, 4K x 72, 8K x 36, 16K x 72, 32K x 72, 64K x 72
Test-Logic
Reset
Run-Test/
Idle
1
0
0
Select-
DR-Scan
Select-
IR-Scan
1
1
1
Capture-IR
0
Capture-DR
0
0
EXit1-DR
1
Pause-DR
0
Exit2-DR
1
Update-DR
1
Exit1-IR
1
Exit2-IR
1
Update-IR
1
1
0
1
1
1
4680 drw12
0
Shift-DR
0
0
0
Shift-IR
0
0
Pause-IR
0
1
Input = TMS
0
01
Figure 7. TAP Controller State Diagram
Refer to the IEEE Standard Test Access Port Specification (IEEE Std.
1149.1) for the full state diagram
All state transitions within the TAP controller occur at the rising edge of the
TCLK pulse. The TMS signal level (0 or 1) determines the state progression
that occurs on each TCLK rising edge. The TAP controller takes precedence
over the FIFO memory and must be reset after power up of the device. See
TRST description for more details on TAP controller reset.
CAPTURE-DR
Data is loaded from the parallel input pins or core outputs into the Data
Register.
SHIFT-DR
The previously captured data is shifted in serially, LSB first at the rising edge
of TCLK in the TDI/TDO path and shifted out serially, LSB first at the falling edge
of TCLK towards the output.
UPDATE-DR
The shifting process has been completed. The data is latched into their
parallel outputs in this state to be accessed through the internal bus.
EXIT1-DR / EXIT2-DR
This is a temporary controller state. If TMS is held high, a rising edge applied
to TCK while in this state causes the controller to enter the Update-DR state. This
terminates the scanning process. All test data registers selected by the current
instruction retain their previous state unchanged.
PAUSE-DR
This controller state allows shifting of the test data register in the serial path
between TDI and TDO to be temporarily halted. All test data registers selected
by the current instruction retain their previous state unchanged.
Capture-IR, Shift-IR and Update-IR, Exit-IR and Pause-IR are
similar to Data registers. These instructions operate on the instruction registers.
NOTES:
1. Five consecutive TCK cycles with TMS = 1 will reset the TAP.
2. TAP controller does not automatically reset upon power-up. The user must provide a reset to the TAP controller (either by TRST or TMS).
3. TAP controller must be reset before normal FIFO operations can begin.

IDT72V72100L10BB

Mfr. #:
Manufacturer:
Description:
IC FIFO 131KX36 10NS 256BGA
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New from this manufacturer.
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