CYRS1543AV18
CYRS1545AV18
Document Number: 001-60007 Rev. *L Page 30 of 34
Glossary
Total Dose Permanent device damage due to ions over device life
Heavy Ion Instantaneous device latch up due to single ion
LET Linear energy transfer (measured in MeVcm
2
)
Krad Unit of measurement to determine device life in radiation environments.
Neutron Permanent device damage due to energetic neutrons or protons
Prompt Dose Data loss of permanent device damage due to X-rays and gamma rays < 20 ns
165-ball Ceramic Column Grid
Array
Hermetic ceramic 165-column package. Columns attached by Six Sigma
RadStop Technology Cypress's patented Rad Hard design methodology
DLAM Defense Logistics Agency Land and Maritime
LSBU Logical Single Bit Upset. Single bits in a single correction word are in error.
LMBU Logical Multi Bit Upset. Multiple bits in a single correction word are in error.
Group A General electrical testing
Group B Mechanical - Dimensions, bond strength, solvents, die shear, solderability, lead integrity,
seal, acceleration
Group C Life test - 1000 hours at 125 C
Group D Package related mechanical tests - shock, vibration, Accel, salt, seal, lead finish
adhesion, lid torque, thermal shock, moisture resistance
Group E Radiation testing
