AD7714
REV. C–18–
Test Register (RS2–RS0 = 1, 0, 0)
The part contains a Test Register which is used in testing the device. The user is advised not to change the status of any of the bits in this
register from the default (Power-On or RESET) status of all 0s as the part will be placed in one of its test modes and will not operate cor-
rectly. If the part enters one of its test modes, exercising RESET will exit the part from the mode. An alternative scheme for getting the
part out of one of its test modes, is to reset the interface by writing 32 successive 1s to the part and then write all 0s to the Test Register.
Data Register (RS2–RS0 = 1, 0, 1)
The Data Register on the part is a read-only register which contains the most up-to-date conversion result from the AD7714. The
register can be programmed to be either 16-bits or 24-bits wide, determined by the status of the WL bit of the Mode Register. If the
Communications Register data sets up the part for a write operation to this register, a write operation must actually take place in
order to return the part to where it is expecting a write operation to the Communications Register (the default state of the interface).
However, the 16 or 24 bits of data written to the part will be ignored by the AD7714.
Zero-Scale Calibration Register (RS2–RS0 = 1, 1, 0); Power On/Reset Status: 1F4000␣ Hex
The AD7714 contains three zero-scale calibration registers, labelled Zero-Scale Calibration Register 0 to Zero Scale Calibration
Register␣ 2. The three registers are totally independent of each other such that in fully differential mode there is a zero-scale register
for each of the input channels. Each of these registers is a 24-bit read/write register and, when writing to the registers, 24 bits must be
written; otherwise no data will be transferred to the register. The register is used in conjunction with the associated full-scale calibra-
tion register to form a register pair. These register pairs are associated with input channel pairs as outlined in Table VII.
While the part is set up to allow access to these registers over the digital interface, the part itself no longer has access to the register
coefficients to correctly scale the output data. As a result, there is a possibility that after accessing the calibration registers (either read
or write operation) the first output data read from the part may contain incorrect data. In addition, a read or write operation to the
calibration register should not be attempted while a calibration is in progress. These eventualities can be avoided by taking either the
SYNC input low or the FSYNC bit of the Mode Register high before the calibration register operation and taking them either high or
low respectively after the operation is complete.
Full-Scale Calibration Register (RS2–RS0 = 1, 1, 1); Power On/Reset Status: 5761AB␣ Hex
The AD7714 contains three full-scale calibration registers, labelled Full-Scale Calibration Register 0 to Full-Scale Calibration Regis-
ter 2. The three registers are totally independent of each other such that in fully differential mode there is a full-scale register for each
of the input channels. Each of these registers is a 24-bit read/write register and, when writing to the registers, 24 bits must be written,
otherwise no data will be transferred to the register. The register is used in conjunction with the associated zero-scale calibration
register to form a register pair. These register pairs are associated with input channel pairs as outlined in Table␣ VII.
While the part is set up to allow access to these registers over the digital interface, the part itself no longer has access to the coeffi-
cients to correctly scale the output data. As a result, there is a possibility that after accessing the calibration registers (either read or
write operation) the first output data read from the part may contain incorrect data. In addition, a read or write operation to the
calibration register should not be attempted while a calibration is in progress. These eventualities can be avoided by taking either the
SYNC input low or the FSYNC bit of the Mode Register high before the calibration register operation and taking them either high or
low respectively after the operation is complete.
CALIBRATION OPERATIONS
The AD7714 contains a number of calibration options as outlined previously. Table XI summarizes the calibration types, the opera-
tions involved and the duration of the operations. There are two methods of determining the end of calibration. The first is to moni-
tor when DRDY returns low at the end of the sequence. DRDY not only indicates when the sequence is complete but also that the
part has a valid new sample in its data register. This valid new sample is the result of a normal conversion which follows the calibra-
tion sequence. The second method of determining when calibration is complete is to monitor the MD2, MD1 and MD0 bits of the
Mode Register. When these bits return to 0, 0, 0 following a calibration command, it indicates that the calibration sequence is com-
plete. This method does not give any indication of there being a valid new result in the data register. However, it gives an earlier
indication that calibration is complete than DRDY. The time to when the Mode Bits (MD2, MD1 and MD0) return to 0, 0, 0
represents the duration of the calibration. The sequence to when DRDY goes low also includes a normal conversion and a pipeline
delay, t
P
(2000 × t
CLK IN
), to correctly scale the results of this first conversion. The time for both methods is given in the table.
Table XI. Calibration Operations
Calibration Type MD2, MD1, MD0 Calibration Sequence Duration to Mode Bits Duration to DRDY
Self Calibration 0, 0, 1 Internal ZS Cal @ Selected Gain + 6 × 1/Output Rate 9 × 1/Output Rate + t
p
Internal FS Cal @ Selected Gain
ZS System Calibration 0, 1, 0 ZS Cal on AIN @ Selected Gain 3 × 1/Output Rate 4 × 1/Output Rate + t
P
FS System Calibration 0, 1, 1 FS Cal on AIN @ Selected Gain 3 × 1/Output Rate 4 × 1/Output Rate + t
P
System-Offset Calibration 1, 0, 0 ZS Cal on AIN @ Selected Gain + 6 × 1/Output Rate 9 × 1/Output Rate + t
P
Internal FS Cal @ Selected Gain
Background Calibration 1, 0, 1 Internal ZS Cal @ Selected Gain + Bits Not Reset 6 × 1/Output Rate
Normal Conversion
ZS Self Calibration 1, 1, 0 Internal ZS Cal @ Selected Gain 3 × 1/Output Rate 6 × 1/Output Rate + t
P
FS Self Calibration 1, 1, 1 Internal FS Cal @ Selected Gain 3 × 1/Output Rate 6 × 1/Output Rate + t
P
2
AD7714
REV. C
–19–
CIRCUIT DESCRIPTION
The AD7714 is a sigma-delta A/D converter with on-chip digi-
tal filtering, intended for the measurement of wide dynamic
range, low frequency signals such as those in weigh-scale, pres-
sure transducer, industrial control or process control applica-
tions. It contains a sigma-delta (or charge-balancing) ADC, a
calibration microcontroller with on-chip static RAM, a clock
oscillator, a digital filter and a bidirectional serial communica-
tions port. The part consumes only 500 µA of power supply
current and features a standby mode which requires only 10 µA,
making it ideal for battery-powered or loop-powered instru-
ments. The part comes in two versions, the AD7714-5, which is
specified for operation from a nominal +5␣ V analog supply
(AV
DD
), and the AD7714-3, which is specified for operation
from a nominal +3.3␣ V analog supply. Both versions can be
operated with a digital supply (DV
DD
) voltage of either +3.3␣ V
or +5␣ V. AD7714Y grade parts operate with a nominal AV
DD
of 3 V or 5 V and can be operated with a digital supply voltage
of either 3 V or 5 V.
The part contains three programmable-gain fully differential
analog input channels that can be reconfigured as five pseudo-
differential inputs. The gain range on all channels is from 1 to
128, allowing the part to accept unipolar signals of between
0 mV to +20␣ mV and 0 V to +2.5␣ V. In bipolar mode, the part
handles genuine bipolar signals of ±20 mV and quasi-bipolar
signals up to ±2.5 V when the reference input voltage equals
+2.5␣ V. With a reference voltage of +1.25␣ V, the input ranges
are from 0 mV to +10 mV to 0 V to +1.25␣ V in unipolar mode,
while in bipolar mode, the part handles genuine bipolar signals
of ±10 mV and quasi-bipolar signals up to ±1.25 V.
The part employs a sigma-delta conversion technique to realize
up to 24 bits of no missing codes performance. The sigma-delta
modulator converts the sampled input signal into a digital pulse
train whose duty cycle contains the digital information. The
programmable gain function on the analog input is also
incorporated in this sigma-delta modulator with the input sam-
pling frequency of the modulator being modified to give the
higher gains. A sinc
3
digital low-pass filter processes the output
of the sigma-delta modulator and updates the output register at
a rate determined by the first notch frequency of this filter. The
output data can be read from the serial port randomly or peri-
odically at any rate up to the output register update rate. The
first notch of this digital filter, its –3␣ dB frequency and its out-
put rate can be programmed via the filter high and filter low
registers. With a master clock frequency of 2.4576 MHz, the
programmable range for this first notch frequency and output
rate is from 4.8␣ Hz to 1.01 kHz giving a programmable range
for the –3␣ dB frequency of 1.26 Hz to 265␣ Hz.
The basic connection diagram for the part is shown in Figure 2.
This shows both the AV
DD
and DV
DD
pins of the AD7714 being
driven from the analog +3␣ V or +5␣ V supply. Some applications
will have AV
DD
and DV
DD
driven from separate supplies. In the
connection diagram shown, the AD7714’s analog inputs are
configured as three fully differential inputs. The part is set up
for unbuffered mode on the these analog inputs. An AD780,
precision +2.5 V reference, provides the reference source for the
part. On the digital side, the part is configured for three-wire
operation with CS tied to DGND. A quartz crystal or ceramic
resonator provides the master clock source for the part. It may
be necessary to connect capacitors on the crystal or resonator to
ensure that it does not oscillate at overtones of its fundamental
operating frequency. The values of capacitors will vary depend-
ing on the manufacturer’s specifications.
SCLK
MCLK IN
DGND
DV
DD
SYNC
RESET
DRDY
CS
MCLK OUT
POL
DIN
DOUT
AIN1
AGND
AIN2
AIN6
AIN3
AIN5
AIN4
REF IN(+)
STANDBY
REF IN(–)
AV
DD
BUFFER
AD7714
0.1mF
0.1mF
10mF
ANALOG
GROUND
DIFFERENTIAL
ANALOG INPUT 3
DIFFERENTIAL
ANALOG INPUT 2
DIFFERENTIAL
ANALOG INPUT 1
DIGITAL
GROUND
0.1mF10mF
V
OUT
V
IN
GND
AD780
ANALOG
+5V SUPPLY
ANALOG
+5V SUPPLY
DATA
READY
RECEIVE
(READ)
SERIAL
DATA
SERIAL
CLOCK
CRYSTAL OR
CERAMIC
RESONATOR
+5V
Figure 2. Basic Connection Diagram
AD7714
REV. C–20–
ANALOG INPUT
Analog Input Ranges
The AD7714 contains six analog input pins (labelled AIN1 to
AIN6) which can be configured as either three fully differential
input channels or five pseudo-differential input channels. Bits
CH0, CH1 and CH2 of the Communications Register configure
the analog input arrangement and the channel selection is as
outlined previously in Table VII. The input pairs (either differ-
ential or pseudo-differential) provide programmable-gain, input
channels which can handle either unipolar or bipolar input
signals. It should be noted that the bipolar input signals are
referenced to the respective AIN(–) input of the input pair.
In unbuffered mode, the common-mode range of these inputs is
from AGND to AV
DD
provided that the absolute value of the analog
input voltage lies between AGND␣ –␣ 30␣ mV and AV
DD
+ 30␣ mV.
This means that in unbuffered mode the part can handle both
unipolar and bipolar input ranges for all gains. In buffered
mode, the analog inputs can handle much larger source imped-
ances, but the absolute input voltage range is restricted to be-
tween AGND␣ + 50␣ mV to AV
DD
– 1.5␣ V which also places
restrictions on the common-mode range. This means that in
buffered mode there are some restrictions on the allowable gains
for bipolar input ranges. Care must be taken in setting up the
common-mode voltage and input voltage range so that the
above limits are not exceeded, otherwise there will be a degrada-
tion in linearity performance.
In unbuffered mode, the analog inputs look directly into the
7␣ pF input sampling capacitor, C
SAMP
. The dc input leakage
current in this unbuffered mode is 1␣ nA maximum. As a result,
the analog inputs see a dynamic load which is switched at the
input sample rate (see Figure 3). This sample rate depends on
master clock frequency and selected gain. C
SAMP
is charged to
AIN(+) and discharged to AIN(–) every input sample cycle.
The effective on-resistance of the switch, R
SW
, is typically 7␣ k.
C
SAMP
must be charged through R
SW
and through any external
source impedances every input sample cycle. Therefore, in unbuf-
fered mode, source impedances mean a longer charge time for
C
SAMP
and this may result in gain errors on the part. Table XII
shows the allowable external resistance/capacitance values, for
unbuffered mode, such that no gain error to the 16-bit level is
introduced on the part. Table XIII shows the allowable external
resistance/capacitance values, once again for unbuffered mode,
such that no gain error to the 20-bit level is introduced.
Table XII. External R, C Combination for No 16-Bit Gain
Error (Unbuffered Mode Only)
Gain External Capacitance (pF)
0 50 100 500 1000 5000
1 368 k 90.6 k 54.2 k 14.6 k 8.2 k 2.2 k
2 177.2 k 44.2 k 26.4 k 7.2 k 4 k 1.12 k
4 82.8 k 21.2 k 12.6 k 3.4 k 1.94 k 540
8–128 35.2 k 9.6 k 5.8 k 1.58 k 880 240
Table XIII. External R, C Combination for No 20-Bit Gain
Error (Unbuffered Mode Only)
Gain External Capacitance (pF)
0 50 100 500 1000 5000
1 290 k 69 k 40.8 k 10.4 k 5.6 k 1.4 k
2 141 k 33.8 k 20 k 5 k 2.8 k 700
4 63.6 k 16 k 9.6 k 2.4 k 1.34 k 340
8–128 26.8 k 7.2 k 4.4 k 1.1 k 600 160
In buffered mode, the analog inputs look into the high impedance
inputs stage of the on-chip buffer amplifier. C
SAMP
is charged via
this buffer amplifier such that source impedances do not affect
the charging of C
SAMP
. This buffer amplifier has an offset leak-
age current of 1␣ nA. In this buffered mode, large source imped-
ances result in a dc offset voltage developed across the source
impedance but not in a gain error.
Input Sample Rate
The modulator sample frequency for the AD7714 remains at
f
CLK␣ IN
/128 (19.2␣ kHz @ f
CLK IN
= 2.4576␣ MHz) regardless of
the selected gain. However, gains greater than 1 are achieved
by a combination of multiple input samples per modulator cycle
and a scaling of the ratio of reference capacitor to input capaci-
tor. As a result of the multiple sampling, the input sample rate
of the device varies with the selected gain (see Table XIV). In
buffered mode, the input is buffered before the input sampling
capacitor. In unbuffered mode, where the analog input looks
directly into the sampling capacitor, the effective input imped-
ance is 1/C
SAMP
× f
S
where C
SAMP
is the input sampling capaci-
tance and f
S
is the input sample rate.
R
SW
(7kV TYP)
HIGH
IMPEDANCE
>1GV
C
SAMP
(7pF )
V
BIAS
SWITCHING FREQUENCY DEPENDS ON
f
CLKIN
AND SELECTED GAIN
AIN(+)
AIN(–)
Figure 3. Unbuffered Analog Input Structure

AD7714ARSZ-5REEL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC CMOS 3V/5V 500uA 24B Signal Condition
Lifecycle:
New from this manufacturer.
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