Si8220/21
Rev. 1.2 7
Figure 3. Common Mode Transient Immunity Test Circuit
Oscilloscope
Isolated
Supply
Si822x
VDD
VO
12V
Supply
High Voltage
Surge Generator
VcmSu rge
Output
High Voltage
Differential Probe
GND
CATHODE
ANODE
InputSignal
Switch
Inpu t
Output
Isolated
Ground
267
Si8220/21
8 Rev. 1.2
3. Regulatory Information
Table 2. Regulatory Information*
CSA
The Si822x is certified under CSA Component Acceptance Notice 5A. For more details, see File 232873.
61010-1: Up to 600 V
RMS
reinforced insulation working voltage; up to 600 V
RMS
basic insulation working voltage.
60950-1: Up to 600 V
RMS
reinforced insulation working voltage; up to 1000 V
RMS
basic insulation working volt-
age.
60601-1: Up to 125 V
RMS
reinforced insulation working voltage; up to 380 V
RMS
basic insulation working voltage.
VDE
The Si822x is certified according to IEC 60747-5-2. For more details, see File 5006301-4880-0001.
60747-5-2: Up to 891 V
peak
for basic insulation working voltage.
60950-1: Up to 600 V
RMS
reinforced insulation working voltage; up to 1000 V
RMS
basic insulation working
voltage.
UL
The Si822x is certified under UL1577 component recognition program. For more details, see File E257455.
Rated up to 5000 V
RMS
isolation voltage for basic protection.
*Note: Regulatory Certifications apply to 2.5 kV
RMS
rated devices which are production tested to 3.0 kV
RMS
for 1 sec.
Regulatory Certifications apply to 3.75 kV
RMS
rated devices which are production tested to 4.5 kV
RMS
for 1 sec.
Regulatory Certifications apply to 5.0 kV
RMS
rated devices which are production tested to 6.0 kV
RMS
for 1 sec.
For more information, see "9.Ordering Guide" on page 22.
Si8220/21
Rev. 1.2 9
Table 3. Insulation and Safety-Related Specifications
Parameter Symbol Test Condition
Value
Unit
WB
SOIC-16
NB
SOIC-8
Nominal Air Gap (Clearance)
1
L(IO1) 8.0 min 4.9 min mm
Nominal External Tracking (Creepage)
1
L(IO2) 8.0 min 4.01 min mm
Minimum Internal Gap (Internal Clearance)
0.014 0.014 mm
Tracking Resistance
(Proof Tracking Index)
PTI IEC60112 600 600 V
Erosion Depth
ED 0.040 0.040 mm
Resistance (Input-Output)
2
R
IO
10
12
10
12
Capacitance (Input-Output)
2
C
IO
f = 1 MHz 2.0 1.0 pF
Input Capacitance
3
C
I
4.0 4.0 pF
Notes:
1. The values in this table correspond to the nominal creepage and clearance values as detailed in "12.Package Outline:
16-Pin Wide Body SOIC" on page 25, "10.Package Outline: 8-Pin Narrow Body SOIC" on page 23. VDE certifies the
clearance and creepage limits as 8.5 mm minimum for the WB SOIC-16 package and 4.7 mm minimum for the NB
SOIC-8 package. UL does not impose a clearance and creepage minimum for component level certifications. CSA
certifies the clearance and creepage limits as 3.9 mm minimum for the NB SOIC-8 and 7.6 mm minimum for the WB
SOIC-16 package.
2. To determine resistance and capacitance, the Si822x is converted into a 2-terminal device. Pins 1–8 (1–4, NB SOIC-8)
are shorted together to form the first terminal and pins 9–16 (5–8, NB SOIC-8) are shorted together to form the second
terminal. The parameters are then measured between these two terminals.
3. Measured from input pin to ground.

SI8220BD-D-ISR

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Gate Drivers 5 kV opto input isolated gate driver
Lifecycle:
New from this manufacturer.
Delivery:
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