AD5371
Rev. B | Page 5 of 28
Parameter Min Typ
1
Max Unit Test Conditions/Comments
1
LVDS INTERFACE (REDUCED RANGE LINK)
Digital Inputs
2
Input Voltage Range 875 1575 mV
Input Differential Threshold –0.1 +0.1 V
External Termination Resistance 80 100 132 Ω
Differential Input Voltage 100 mV
POWER REQUIREMENTS
DV
CC
2.5 5.5 V
V
DD
9 16.5 V
V
SS
−16.5 −4.5 V
Power Supply Sensitivity
2
∆Full Scale/∆V
DD
−75 dB
∆Full Scale/∆V
SS
−75 dB
∆Full Scale/∆DV
CC
−90 dB
DI
CC
2 mA
DV
CC
= 5.5 V, V
IH
= DV
CC
, V
IL
= GND; normal
operating conditions
I
DD
18 mA Outputs unloaded, DAC outputs = 0 V
20 mA Outputs unloaded, DAC outputs = full scale
I
SS
−18 mA Outputs unloaded, DAC outputs = 0 V
−20 mA Outputs unloaded, DAC outputs = full scale
Power Dissipation Unloaded (P) 280 mW V
SS
= −8 V, V
DD
= 9.5 V, DV
CC
= 2.5 V
Power-Down Mode Control register power-down bit set
DI
CC
5 μA
I
DD
35 μA
I
SS
−35 μA
Junction Temperature
3
130 °C T
J
= T
A
+ P
TOTAL
× θ
JA
1
Typical specifications are at 25°C.
2
Guaranteed by design and characterization; not production tested.
3
θ
JA
represents the package thermal impedance.
AC CHARACTERISTICS
DV
CC
= 2.5 V; V
DD
= 15 V; V
SS
= −15 V; VREF = 3 V; AGND = DGND = SIGGNDx = 0 V; C
L
= 200 pF; R
L
= 10 kΩ; gain (M), offset (C),
and DAC offset registers at default values; all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 3. AC Characteristics
1
Parameter Min Typ Max Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time 20 μs Settling to 1 LSB from a full-scale change
30 μs DAC latch contents alternately loaded with all 0s and all 1s
Slew Rate 1 V/μs
Digital-to-Analog Glitch Energy 5 nV-s
Glitch Impulse Peak Amplitude 10 mV
Channel-to-Channel Isolation 100 dB VREF0, VREF1, VREF2 = 2 V p-p, 1 kHz
DAC-to-DAC Crosstalk 20 nV-s
Digital Crosstalk 0.2 nV-s
Digital Feedthrough 0.02 nV-s Effect of input bus activity on DAC output under test
Output Noise Spectral Density @ 10 kHz 250 nV/√Hz V
REF
= 0 V
1
Guaranteed by design and characterization; not production tested.