LTC3676/LTC3676-1
7
3676fe
For more information www.linear.com/LTC3676
ELECTRICAL CHARACTERISTICS
The l denotes the specifications which apply over the specified operating
junction temperature range, otherwise specifications are at T
A
= 25°C (Note 2). V
IN
= PV
IN1
= PV
IN2
= PV
IN3
= PV
IN4
= V
IN_L2
= V
IN_L3
=
V
IN_L4
= DV
DD
= 3.8V. All regulators disabled unless otherwise noted.
PARAMETER CONDITIONS MIN TYP MAX UNITS
Undervoltage Lockout Rising
Undervoltage Lockout Falling
l
l
2.35
2.55
2.45
2.65 V
V
Undervoltage W
arning CNTRL[4:2] = 000 (POR Default)
CNTRL[4:2] = 001
CNTRL[4:2] = 010
CNTRL[4:2] = 011
CNTRL[4:2] = 100
CNTRL[4:2] = 101
CNTRL[4:2] = 110
CNTRL[4:2] = 111
2.7
2.8
2.9
3.0
3.1
3.2
3.3
3.4
V
V
V
V
V
V
V
V
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
I
2
C Port
DV
VDD
DV
DD
Input Supply Voltage
l
1.6 5.5 V
I
DVDD
DV
DD
Quiescent Current SCL/SDA = 0kHz 0.3 1 µA
DV
VDD_UVLO
DV
DD
UVLO Level 1 V
ADDRESS LTC3676 Device Address
LTC3676-1 Device Address
0111100[R/
W]
0111101[R/W]
V
IH
SDA/SCL Input Threshold Rising 70 %DV
DD
V
IL
SDA/SCL Input Threshold Falling 30 %DV
DD
I
IH
SDA/SCL High Input Current SDA = SCL = 5.5V –1 0 1 µA
I
IL
SDA/SCL Low Input Current SDA = SCL = 0V –1 0 1 µA
V
OL_SDA
SDA Output Low Voltage I
SDA
= 3mA 0.4 V
f
SCL
Clock Operating Frequency 400 kHz
t
BUF
Bus Free Time Between Stop and Start
Condition
1.3 µs
t
HD_STA
Hold Time After Repeated Start Condition 0.6 µs
t
SU_STA
Repeated Start Condition Setup Time 0.6 µs
t
SU_STO
Stop Condition Setup Time 0.6 µs
t
HD_DAT(O)
Data Hold Time Output 0 900 ns
t
HD_DAT(I)
Data Hold Time Input 0 ns
t
SU_DAT
Data Setup Time 100 ns
t
LOW
SCL Clock Low Period 1.3 µs
t
HIGH
SCL Clock High Period 0.6 µs
t
f
Clock/Data Fall Time C
B
= Capacitance of BUS Line (pF) 20 + 0.1C
B
300 ns
t
r
Clock/Data Rise Time C
B
= Capacitance of BUS Line (pF) 20 + 0.1C
B
300 ns
t
SP
Input Spike Suppression Pulse Width 50 ns
Note 1: Stresses beyond those listed Under Absolute Maximum ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum rating condition for extended periods may affect device
reliability and lifetime.
Note 2:
The LTC3676 is tested under pulsed load conditions such that
T
J
≈ T
A
. The LTC3676E is guaranteed to meet specifications from
0°C to 85°C junction temperature. Specifications over the –40°C to
125°C operating junction temperature range are assured by design,
characterization and correlation with statistical process controls. The
LTC3676I is guaranteed over the –40°C to 125°C operating junction
temperature range and the LTC3676H is guaranteed over the full –40°C to
150°C operating junction temperature range. High junction temperatures
degrade operating lifetimes; operating lifetime is derated for junction
temperatures greater than 125°C. The junction temperature (T
J
in °C) is
calculated from the ambient temperature (T
A
in °C) and power dissipation
(P
D
, in Watts), and package to junction ambient thermal impedance
(J
A
in Watts/°C ) according to the formula:
T
J
= T
A
+ (P
D
• J
A
).
Note that the maximum ambient temperature consistent with these
specifications is determined by specific operating conditions in
conjunction with board layout, the rated package thermal impedance and
other environmental factors.
