©2013 Silicon Storage Technology, Inc. DS-20005014B 11/2013
13
16 Mbit Multi-Purpose Flash Plus
SST39WF1601 / SST39WF1602
Data Sheet
5. With A
MS
-A
4
= 0; Sec ID is read with A
3
-A
0
,
SST ID is read with A
3
= 0 (Address range = 000000H to 000007H),
User ID is read with A
3
= 1 (Address range = 000008H to 00000FH).
User ID Lock Status is read with A
7
-A
0
= 0000FFH. Unlocked: DQ
3
= 1 / Locked: DQ
3
=0.
6. Valid Word-Addresses for Sec ID are from 000000H-000007H and 000008H to 00000FH.
7. The device does not remain in Software Product ID Mode if powered down.
8. With A
MS
-A
1
=0; SST Manufacturer ID = 00BFH, is read with A
0
=0,
SST39WF1601 Device ID = BF274BH, is read with A
0
=1,
SST39WF1602 Device ID = BF274AH, is read with A
0
=1.
A
MS
= Most significant address
A
MS
=A
19
for SST39WF1601/1602
9. Both Software ID Exit operations are equivalent
10. If users never lock after programming, Sec ID can be programmed over the previously unprogrammed bits (data=1)
using the Sec ID mode again (the programmed “0” bits cannot be reversed to “1”). Valid Word-Addresses for Sec ID are
from 000000H-000007H and 000008H to 00000FH.
Table 7: CFI Query Identification String
1
1. Refer to CFI publication 100 for more details.
Address Data Data
10H 0051H Query Unique ASCII string “QRY”
11H 0052H
12H 0059H
13H 0002H Primary OEM command set
14H 0000H
15H 0000H Address for Primary Extended Table
16H 0000H
17H 0000H Alternate OEM command set (00H = none exists)
18H 0000H
19H 0000H Address for Alternate OEM extended Table (00H = none exits)
1AH 0000H
T7.0 20005014
Table 8: System Interface Information
Address Data Data
1BH 0016H V
DD
Min (Program/Erase)
DQ
7
-DQ
4
: Volts, DQ
3
-DQ
0
: 100 millivolts
1CH 0020H V
DD
Max (Program/Erase)
DQ
7
-DQ
4
: Volts, DQ
3
-DQ
0
: 100 millivolts
1DH 0000H V
PP
min. (00H = no V
PP
pin)
1EH 0000H V
PP
max. (00H = no V
PP
pin)
1FH 0005H Typical time out for Word-Program 2
N
µs (2
5
=32µs)
20H 0000H Typical time out for min. size buffer program 2
N
µs (00H = not supported)
21H 0005H Typical time out for individual Sector/Block-Erase 2
N
ms (2
5
=30ms)
22H 0007H Typical time out for Chip-Erase 2
N
ms (2
7
= 128 ms)
23H 0001H Maximum time out for Word-Program 2
N
times typical (2
1
x2
5
=64µs)
24H 0000H Maximum time out for buffer program 2
N
times typical
25H 0001H Maximum time out for individual Sector/Block-Erase 2
N
times typical (2
1
x2
5
=64ms)
26H 0001H Maximum time out for Chip-Erase 2
N
times typical (2
1
x2
7
= 256 ms)
T8.0 20005014
