ADC1415S_SER All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 4 — 17 December 2010 19 of 42
NXP Semiconductors
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
The integrated input buffer offers the following advantages:
The kickback effect is avoided - the charge injection and glitches generated by the
S/H input stage are isolated from the input circuitry. So there’s no need for additional
filtering.
The input capacitance is very low and constant over a wide frequency range, which
makes the ADC1415S easy to drive.
The sample phase occurs when the internal clock (derived from the clock signal on pin
CLKP/CLKM) is HIGH. The voltage is then held on the sampling capacitors. When the
clock signal goes LOW, the stage enters the hold phase and the voltage information is
transmitted to the ADC core.
Fig 14. Input sampling circuit and input buffer
005aaa107
INP
package ESD parasitics
switch
R
on
= 15 Ω
4 pF
4 pF
sampling
capacitor
sampling
capacitor
switch
R
on
= 15 Ω
INM
8
7
internal
clock
internal
clock
INPUT
BUFFER
ADC1415S_SER All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 4 — 17 December 2010 20 of 42
NXP Semiconductors
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
11.2.2 Transformer
The configuration of the transformer circuit is determined by the input frequency. The
configuration shown in Figure 15
would be suitable for a baseband application.
The configuration shown in Figure 16 is recommended for high frequency applications. In
both cases, the choice of transformer is a compromise between cost and performance.
Fig 15. Single transformer configuration suitable for baseband applications
Fig 16. Dual transformer configuration suitable for high intermediate frequency
application
005aaa10
8
100 nF
100 nF
100 nF
100 nF
INP
INM
VCM
Analog
input
ADT1-1WT
100 nF
100 nF
50 Ω
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9
100 nF
100 nF
100 nF
INP
INM
100 Ω
50 Ω
50 Ω
ADT1-1WTADT1-1WT
Analog
input
100 nF
100 nF
VCM
100 nF
ADC1415S_SER All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 4 — 17 December 2010 21 of 42
NXP Semiconductors
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
11.3 System reference and power management
11.3.1 Internal/external references
The ADC1415S has a stable and accurate built-in internal reference voltage to adjust the
ADC full-scale. This reference voltage can be set internally via SPI or with pins VREF and
SENSE (programmable in 1 dB steps between 0 dB and 6 dB via control bits
INTREF[2:0] when bit INTREF_EN = logic 1; see Table 21
) See Figure 18 to Figure 21.
The equivalent reference circuit is shown in Figure 17
. External reference is also possible
by providing a voltage on pin VREF as described in Figure 20
.
If bit INTREF_EN is set to logic 0, the reference voltage is determined either internally or
externally as detailed in Table 11
.
[1] The voltage on pin VREF is doubled internally to generate the internal reference voltage.
Fig 17. Reference equivalent schematic
Table 11. Reference selection
Selection SPI bit
INTREF_EN
SENSE pin VREF pin Full-scale (p-p)
internal
(Figure 18
)
0 AGND 330 pF capacitor to AGND 2 V
internal
(Figure 19
)
0 pin VREF connected to pin SENSE and
via a 330 pF capacitor to AGND
1 V
external
(Figure 20
)
0V
DDA(3V)
external voltage between
0.5 V and 1 V
[1]
1 V to 2 V
internal via SPI
(Figure 21
)
1 pin VREF connected to pin SENSE and
via 330 pF capacitor to AGND
1 V to 2 V
EXT_ref
EXT_ref
005aaa164
REFAT/
REFBT
REFAB/
REFBB
SENSE
VREF
SELECTION
LOGIC
BANDGAP
REFERENCE
ADC CORE
BUFFER
REFERENCE
AMP

ADC1415S125/DB,598

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
BOARD DEMO FOR ADC1415S125
Lifecycle:
New from this manufacturer.
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