ADC1610S_SER 4 © IDT 2012. All rights reserved.
Product data sheet Rev. 04 — 2 July 2012 34 of 38
Integrated Device Technology
ADC1610S series
Single 16-bit ADC; CMOS or LVDS DDR digital output
Table 27. Test pattern register 2 (address 0015h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 0 TESTPAT_USER[15:8] R/W 00000000 custom digital test pattern (bits 13 to 6)
Table 28. Test pattern register 3 (address 0016h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 0 TESTPAT_USER[7:0] R/W 00000000 custom digital test pattern (bits 7 to 0)
Table 29. Fast OTR register (address 0017h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 4 - 0000 not used
3 FASTOTR R/W fast OuT-of-Range (OTR) detection
0 disabled
1 enabled
2 to 0 FASTOTR_DET[2:0] R/W set fast OTR detect level
000 20.56 dB
001 16.12 dB
010 11.02 dB
011 7.82 dB
100 5.49 dB
101 3.66 dB
110 2.14 dB
111 0.86 dB
Table 30. CMOS output register (address 0020h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 4 - 0000 not used
3 to 2 DAV_DRV[1:0] R/W drive strength for DAV CMOS output buffer
00 low
01 medium
10 high
11 very high
1 to 0 DATA_DRV[1:0] R/W drive strength for DATA CMOS output buffer
00 low
01 medium
10 high
11 very high