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Figure 18. Pixel Readout (x_odd_inc = 3, y_odd_inc = 3, xy_bin = 1)
X Incrementing
Y Incrementing
Binning Limitations
Binning requires a different sequencing of the pixel array
and imposes different timing limits on the operation of the
sensor. In particular, xy-binning requires two READ
operations from the pixel array for each line of output data,
which has the effect of increasing the minimum line
blanking time.
As a result, when xy-binning is enabled, some of the
programming limits declared in the parameter limit registers
are no longer valid. In addition, the default values for some
of the manufacturer-specific registers need to be
reprogrammed. None of these adjustments are required for
x-binning. The sensor must be taken out of streaming mode
before switching between binned and non-binned operation.
The row addresses for various binning modes are shown in
Table 7.
Table 7. ROW ADDRESS SEQUENCING (BINNING)
Normal
Binning Sequence 1 Binning Sequence 2
0 0, 2 No Data
1 1, 3 No Data
2 No Data 2, 4
3 No Data 3, 5
4 4, 6 No Data
5 5, 7 No Data
6 No Data 6, 8
7 No Data 7, 9
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Raw Data Format
The sensor core image data is read out in a progressive
scan. Valid image data is surrounded by horizontal blanking
and vertical blanking, (see Figure 19). The amount of
horizontal blanking and vertical blanking is programmable.
LV is HIGH during the shaded region of the figure.
Figure 19. Valid Image Data
P
0,0
P
0,1
P
0,2
P
0,0
P
0,n
P
0,1
P
1,1
P
2,1
P
1,n1
P
1,n
P
m1,0
P
m1,1
P
m1,2
P
m1,n1
P
m1,n
P
m,0
P
m,1
P
m,2
P
m,n1
P
m,n
Valid Image Horizontal Blanking
Vertical/Horizontal
Blanking
Vertical Blanking
00 00 00
00 00 00
00 00 00
00 00 00
00 00 00
00 00 00
00 00 00
00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
00 00 00 00 00 00
Raw Data Timing
The sensor core output data is synchronized with the
PIXCLK output. When LV is HIGH, one pixel’s data is
output on the 10-bit D
OUT
output bus every PIXCLK period.
By default, the PIXCLK signal runs at the same frequency
as the master clock, and its falling edges occur one-half of
a master clock period after transitions on LV, FV, and
D
OUT
[9:0] (see Figure 20). This allows PIXCLK to be used
as a clock to sample the data. PIXCLK is continuously
enabled, even during the blanking period.
Figure 20. Pixel Data Timing Example
LINE_VALID
PIXCLK
D
OUT
0D
OUT
9
P
0
(9:0)
P
1
(9:0)
P
2
(9:0)
P
3
(9:0)
P
4
(9:0)
P
n1
(9:0)
P
n
(9:0)
Valid Image DataBlanking Blanking
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Input Interface to Image Flow Processor
The input interface to the IFP is the front end of the IFP,
in which it will choose between the sensor core output or
a test pattern generator output. During normal operation,
a stream of raw Bayer image data from the sensor is
continuously fed into the IFP. For testing purposes, the test
generator output is selected. The generator provides
a selection of test patterns sufficient for basic testing of the
IFP. Program variable (ID = 7, Offset = 0x66) followed by
REFRESH command to the sequencer in order to access
different test patterns (see Table 8).
Depending on which test pattern has been selected, the
user might need to program additional registers in order to
see the intended effects.
Table 8. AVAILABLE TEST PATTERNS
Test Pattern Registers/Variables Example
Flat Field mode_common
settings_test_mode
(ID = 7, Offset = 0x66) = 1
test_pxl_red (R0x0102) = 0x1ff
test_pxl_g1 (R0x0104) = 0x1ff
test_pxl_g2 (R0x0106) = 0x1ff
test_pxl_blue (R0x0108) = 0x1ff
Vertical Ramp mode_common_
mode_settings
test_mode
(ID = 7, Offset = 0x66) = 2
Color Bar mode_common_
mode_settings
test_mode
(ID = 7, Offset = 0x66) = 3
Vertical Stripes mode_common
settings_test_mode
(ID = 7, Offset = 0x66) = 4
test_pxl_red (R0x0102) = 0x1ff
test_pxl_g1 (R0x0104) = 0x17d
test_pxl_g2 (R0x0106) = 0x000
test_pxl_blue (R0x0108) = 0x000
Pseudo-Random mode_common_mode
settings_test_mode
(ID = 7, Offset = 0x66) = 5
Horizontal Stripes mode_common
settings_test_mode
(ID = 7, Offset = 0x66) = 6
test_pxl_red (R0x0102) = 0x1ff
test_pxl_g1 (R0x0104) = 0x17d
test_pxl_g2 (R0x0106) = 0x000
test_pxl_blue (R0x0108) = 0x000

MT9D115D00STCK25AC1-200

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Manufacturer:
ON Semiconductor
Description:
INTEGRATED CIRCUIT
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