©2011 Silicon Storage Technology, Inc. DS25085A 10/11
22
8 Mbit Firmware Hub
SST49LF008A
Data Sheet
A
Microchip Technology Company
Electrical Specifications
The AC and DC specifications for the FWH Interface signals (FWH[3:0], CLK, FWH4, and RST#) as
defined in Section 4.2.2 of the PCI Local Bus Specification, Rev. 2.1. Refer to Table 12 for the DC voltage
and current specifications. Refer to the tables on pages 24 through 29 for the AC timing specifications for
Clock, Read/Write, and Reset operations.
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute
Maximum Stress Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these conditions or conditions greater than those defined in the
operational sections of this data sheet is not implied. Exposure to absolute maximum stress rating con-
ditions may affect device reliability.)
Temperature Under Bias .............................................. -55°C to +125°C
Storage Temperature................................................. -65°C to +150°C
D. C. Voltage on Any Pin to Ground Potential .............................-0.5V to V
DD
+0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential
1
.................-2.0V to V
DD
+2.0V
1. Do not violate processor or chipset limitations on the INIT# pin.
Package Power Dissipation Capability (T
A
=25°C).................................... 1.0W
Surface Mount Solder Reflow Temperature
2
...........................260°C for 10 seconds
2. Excluding certain with-Pb 32-PLCC units, all packages are 260°C capable in both non-Pb and with-Pb solder versions.
Certain with-Pb 32-PLCC package types are capable of 240°C for 10 seconds; please consult the factory for the latest
information.
Output Short Circuit Current
3
................................................... 50mA
3. Outputs shorted for no more than one second. No more than one output shorted at a time. This note applies to non-PCI
outputs.
Table 10:Operating Range
Range Ambient Temp V
DD
Commercial 0°C to +85°C 3.0-3.6V
T10.1 25085
Table 11:AC Conditions of Test
1,2
1. See Figures 23 and 24
2. FWH interface signals use PCI load test conditions
Input Rise/Fall Time Output Load
3ns C
L
=30pF
T11.1 25085
©2011 Silicon Storage Technology, Inc. DS25085A 10/11
23
8 Mbit Firmware Hub
SST49LF008A
Data Sheet
A
Microchip Technology Company
DC Characteristics
Table 12:DC Operating Characteristics (All Interfaces)
Symbol Parameter
Limits
Test Conditions
1
1. Test conditions apply to PP mode.
Min Max
Unit
s
I
DD
Active V
DD
Current LCLK (FWH mode) and Address Input (PP
mode)=V
ILT
/V
IHT
at f=33 MHz (FWH mode)or1/
TRC
min
(PP Mode)
All other inputs=V
IL
or V
IH
Read 12 mA All outputs = open, V
DD
=V
DD
Max
Write
2
2. I
DD
active while Erase or Program is in progress.
24 mA See Note
3
3. For PP Mode: OE# = WE# = V
IH;
For FWH mode:f=1/T
RC
min, LFRAME# = V
IH,
CE# = V
IL.
I
SB
Standby V
DD
Current
(FWH Interface)
100 µA LCLK (FWH mode) and Address Input (PP
mode)=V
ILT
/V
IHT
at f=33 MHz (FWH mode)or1/
TRC min
(PP Mode)
LFRAME#=0.9 V
DD
, f=33 MHz, CE#=0.9 V
DD
,
V
DD
=V
DD
Max, All other inputs 0.9 V
DD
or 0.1
V
DD
I
RY
4
4. The device is in Ready Mode when no activity is on the FWH bus.
Ready Mode V
DD
Cur-
rent
(FWH Interface)
10 mA LCLK (FWH mode) and Address Input (PP
mode)=V
ILT
/V
IHT
at f=33 MHz (FWH mode)or1/
TRC min
(PP Mode)
LFRAME#=V
IL
, f=33 MHz, V
DD
=V
DD
Max
All other inputs 0.9 V
DD
or 0.1 V
DD
I
I
Input Current for IC,
ID [3:0] pins
200 µA V
IN
=GND to V
DD
,V
DD
=V
DD
Max
I
LI
Input Leakage Current 1 µA V
IN
=GND to V
DD
,V
DD
=V
DD
Max
I
LO
Output Leakage Cur-
rent
AV
OUT
=GND to V
DD
,V
DD
=V
DD
Max
V
IHI
5
5. Do not violate processor or chipset specification regarding INIT# voltage.
INIT# Input High Volt-
age
1.0 V
DD
+0.
5
VV
DD
=V
DD
Max
V
ILI
5
INIT# Input Low Volt-
age
-0.5 0.4 V V
DD
=V
DD
Min
V
IL
Input Low Voltage -0.5 0.3
V
DD
VV
DD
=V
DD
Min
V
IH
Input High Voltage 0.5
V
DD
V
DD
+0.
5
VV
DD
=V
DD
Max
V
OL
Output Low Voltage 0.1
V
DD
VI
OL
=1500µA, V
DD
=V
DD
Min
V
OH
Output High Voltage 0.9
V
DD
VI
OH
=-500 µA, V
DD
=V
DD
Min
T12.10 25085
©2011 Silicon Storage Technology, Inc. DS25085A 10/11
24
8 Mbit Firmware Hub
SST49LF008A
Data Sheet
A
Microchip Technology Company
Table 13:Recommended System Power-up Timings
Symbol Parameter Minimum Units
T
PU-READ
1
Power-up to Read Operation 100 µs
T
PU-WRITE
1
Power-up to Write Operation 100 µs
T13.2 25085
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter
Table 14:Pin Impedance (V
DD
=3.3V, T
A
=25 °C, f=1 Mhz, other pins open)
Parameter Description Test Condition Maximum
C
I/O
1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
I/O Pin Capacitance V
I/O
=0V 12pF
C
IN
1
Input Capacitance V
IN
=0V 12pF
L
PIN
2
2. Refer to PCI spec.
Pin Inductance 20 nH
T14.4 25085
Table 15:Reliability Characteristics
Symbol Parameter Minimum Specification Units Test Method
N
END
1
1. This parameter is measured only for initial qualification and after a design or process change that could affect this
parameter.
Endurance 10,000 Cycles JEDEC Standard A117
T
DR
1
Data Retention 100 Years JEDEC Standard A103
I
LTH
1
Latch Up 100 + I
DD
mA JEDEC Standard 78
T15.3 25085
Table 16:Clock Timing Parameters
Symbol Parameter Min Max Units
T
CYC
CLK Cycle Time 30 ns
T
HIGH
CLK High Time 11 ns
T
LOW
CLK Low Time 11 ns
- CLK Slew Rate (peak-to-peak) 1 4 V/ns
- RST# or INIT# Slew Rate 50 mV/ns
T16.1 25085

SST49LF008A-33-4C-NHE

Mfr. #:
Manufacturer:
Microchip Technology
Description:
NOR Flash 8M (1Mx8) 33MHz Commercial Temp
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