Lattice Semiconductor ispMACH 5000VG Family Data Sheet
13
DC Electrical Characteristics
Over Recommended Operating Conditions
Symbol Parameter Condition Min Typ Max Units
I
IL
, I
IH
1
Input or I/O Leakage Current 0V
≤
V
IN
≤
V
IH
(MAX) — — +/-10
µ
A
I
PU
2
I/O Weak Pull-up Resistor Current 0
≤
V
IN
≤
0.7 V
CCO
V
CCO
= 3.3 -30 — -150
µ
A
V
CCO
= 2.5 -20 — -150
µ
A
V
CCO
= 1.8 -10 — -150
µ
A
I
PD
2
I/O Weak Pull-down Resistor Current V
IL
(MAX)
≤
V
IN
≤ V
IH
(MAX) 30 — 150 µA
I
BHLS
2
Bus Hold Low Sustaining Current V
IN
= V
IL
(MAX) 30 — — µA
I
BHHS
2
Bus Hold High Sustaining Current V
IN
= 0.7 V
CCO
V
CCO
= 3.3 -30 — — µA
V
CCO
= 2.5 -20 — — µA
V
CCO
= 1.8 -10 — — µA
I
BHLO
2
Bus Hold Low Overdrive Current 0V ≤ V
IN
≤ V
IH
(MAX) — — 150 µA
I
BHHO
2
Bus Hold High Overdrive Current 0V ≤ V
IN
≤ V
IH
(MAX) — — -150 µA
I
CC
3, 4, 5
Operating Power Supply Current V
CC
= 3.3V — 380 — mA
V
BHT
Bus Hold Trip Points V
IL
(MAX)
—
V
IH
(MIN)
V
C
1
I/O Capacitance
3
V
CC
= 3.3V, V
IO
= 0 to V
IH
(MAX)
—10 —pf
V
CCO
= 3.3V, 2.5, 1.8, 1.5
C
2
Clock Capacitance
3
V
CC
= 3.3V, V
IO
= 0 to V
IH
(MAX)
—10—pf
V
CCO
= 3.3V, 2.5, 1.8, 1.5
C
3
Global Input Capacitance
3
V
CC
= 3.3V, V
IO
= 0 to V
IH
(MAX)
—10—pf
V
CCO
= 3.3V, 2.5, 1.8, 1.5
1. Input or I/O leakage current is measured with the pin configured as an input or as an I/O with the output driver tri-stated. It is not
measured with the output driver active. Bus maintenance circuits are disabled.
2. Only available for LVCMOS and LVTTL standards.
3. T
A
= 25°C, f = 1.0MHz.
4. Device configured with 16-bit counters.
5. I
CC
varies with specific device configuration and operating frequency.
