Lattice Semiconductor ispMACH 5000VG Family Data Sheet
28
ispMACH 5000VG Typical Power vs. Frequency
Power Estimation Coefcients
Device K0 K1 K2 K3 K4 K5 K6 I
DC
(mA) I
DCO
(mA)
ispMACH 5768VG 0.0014 0.0014 0.054 1.5 0.152 0.105 5.0 65 20
ispMACH 51024VG 0.0014 0.0014 0.054 1.5 0.152 0.105 5.0 80 20
Note: For further information about the use of these coefcients, refer to Technical Note TN1002, Power Estimation in ispMACH 5000VG
Devices.
K0 = average current per product term in high power/MHz
K1 = average current per product term in low power/MHz
K2 = average current per GRP line/MHz
K3 = average current per PLL/MHz
K4 = DC current per product terms in high power
K5 = DC current per product terms in low power
K6 = Static DC current per PLL
I
DC
= Static device current with all product terms powered off
I
DCO
= Static I/O bank current
Icc estimates are based on typical conditions (Vcc = 3.3V, room temperature) and an assumption of one GLB load on average exists. These
values are for estimates only. Since the value of Icc is sensitive to operating conditions and the program in the device, the actual Icc should be
veried.
100
060120 150 180
f
MAX
(MHz)
I
CC
(mA)
Note: The devices are configured with maximum number of 16-bit counters, no PLL, typical current at 3.3V, 25° C.
300
600
700
500
400
200
0
51024VG High Power Mode
5768VG High Power Mode
100
060120 150 180
f
MAX
(MHz)
I
CC
(mA)
300
600
700
500
400
200
0
5768VG Low Power Mode
51024VG Low Power Mode
ispMACH 5000VG I
CC
Curves
at High Power Mode
ispMACH 5000VG I
CC
Curves
at Low Power Mode
Power Consumption
Lattice Semiconductor ispMACH 5000VG Family Data Sheet
29
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specic values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Output test conditions for all other interfaces are determined by the respective standards. For further details,
please refer to the following technical note:
ispMACH 5000VG sysIO Design and Usage Guidelines (TN1000)
Table 3. Test Fixture Required Components
Test Condition R
1
R
2
C
L
Timing Ref. V
CCO
Default LVCMOS 3.3 I/O (L -> H, H -> L) 110 110 35pF 1.5 3.0V
Other LVCMOS Settings, (L -> H, H -> L) ∞∞ 35pF
LVCMOS 3.3 = 1.5V LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = V
CCO
/2 LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = V
CCO
/2 LVCMOS 1.8 = 1.65V
Default LVCMOS 3.3 I/O (Z -> H) 110 35pF 1.5V 3.0V
Default LVCMOS 3.3 I/O (Z -> L) 110 35pF 1.5V 3.0V
Default LVCMOS 3.3 I/O (H -> Z) 110 5pF V
OH
- 0.3 3.0V
Default LVCMOS 3.3 I/O (L -> Z) 110 5pF V
OL
+ 0.3 3.0V
V
CCO
R
1
R
2
C
L
*
DUT
Test
Point
*C
L
includes Test Fixture and Probe Capacitance.
0213A/ispm5kvg
Lattice Semiconductor ispMACH 5000VG Family Data Sheet
30
Signal Descriptions
Signal Names Description
TMS Input - This pin is the Test Mode Select input, which is used to control the 1149.1 state machine.
TCK Input - This pin is the Test Clock input pin, used to clock the 1149.1 state machine.
TDI Input - This pin is the 1149.1 Test Data In pin, used to load data.
TDO Output - This pin is the 1149.1 Test Data Out pin used to shift data out.
TOE Input - Test Output Enable pin. TOE tristates all I/O pins when a logic low is driven.
GOE0, GOE1 Input - These two pins are the Global Output Enable input pins.
RESETB
Dedicated Reset Input - This pin resets all registers in the devices. The global polarity (active high or
low input) for this pin is selectable.
xyzz (e.g. 0A16)
Input/Output - These are the general purpose I/O used by the logic array.
x is segment reference
(numeric),
y is GLB reference (alpha) and z is macrocell reference (numeric).
x: 0-7 (1024)
x: 0-5 (768)
y: A-D
z: 0-31
GND Ground
NC No connect
V
CC
Vcc - These are the power supply pins for the logic core.
GCLK0, GCLK3 Input - These pins are congured to be either dedicated CLK input or PLL input.
GCLK1, GCLK2 Input - These pins are dedicated CLK input.
CLK_OUT0,
CLK_OUT1
Output - These pins are the PLL output pins.
PLL_RST0,
PLL_RST1
Input - These pins are for resetting the PLL, input clock (M) divider.
VREF0, VREF1,
VREF2, VREF3
Input - These are the reference supplies for the I/O banks.
PLL_FBK0,
PLL_FBK1
Input - These PLL feedback inputs allow optional external PLL feedback.
V
CCP0
, V
CCP1
V
CC
- These are the V
CC
supplies for the PLLs.
V
CCO0
, V
CCO1
, V
CCO2
,
V
CCO3
V
CC
- These are the V
CC
supplies for each I/O bank.
GNDP0, GNDP1 GND - These are the separate ground connections for the PLLs.
V
CCJ
V
CC
- This pin is for the 1149.1 test access port.
Note: For above, signal CLK_OUT0 connects to PLL0, and signal CLK_OUT1 connects to PLL1.

LC5768VG-12F256I

Mfr. #:
Manufacturer:
Lattice
Description:
CPLD - Complex Programmable Logic Devices PROGRAM EXPANDED LOG
Lifecycle:
New from this manufacturer.
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