LTC6803-1/LTC6803-3
4
680313fa
ELECTRICAL CHARACTERISTICS
The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at T
A
= 25°C. V
+
= 43.2V, V
= 0V, unless otherwise noted.
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
V
REF2
2nd Reference Voltage
l
2.25
2.1
2.5
2.5
2.75
2.9
V
V
V
REG
Regulator Pin Voltage 10V < V
+
< 50V, No Load
I
LOAD
= 4mA
l
l
4.5
4.5
5.0
5.0
5.5 V
V
Regulator Pin Short-Circuit Limit
l
8 mA
I
B
Input Bias Current In/Out of Pins C1 Through C12
When Measuring Cell
When Not Measuring Cell
–10
1
10
µA
nA
I
S
Supply Current, Measure Mode
(Note 7)
Current Into the V
+
Pin When Measuring
Continuous Measuring (CDC = 2)
Continuous Measuring (CDC = 2)
Measure Every 130ms (CDC = 5)
Measure Every 500ms (CDC = 6)
Measure Every 2 Seconds (CDC = 7)
l
l
l
l
620
600
190
140
55
780
780
250
175
70
1000
1150
360
250
105
µA
µA
µA
µA
µA
I
QS
Supply Current, Standby Current Into V
+
Pin When In Standby, All Serial
Port Pin at Logic “1”
LTC6803IG
LTC6803HG
l
l
8
6
6
12
12
12
16.5
18
19
µA
µA
µA
I
CS
Supply Current, Serial I/O Current Into V
+
Pin During Serial
Communications, All Serial Port Pins at Logic “0”.
V
MODE
= “0”, This Current is Added to I
S
or I
QS
LTC6803IG
LTC6803HG
l
l
3.1
3
3
3.9
3.9
3.9
4.3
4.5
4.9
mA
mA
mA
I
SD
Supply Current, Hardware Shutdown Current Out of V
, V
C12
= 43.2V, V
+
Floating
(Note 8)
l
0.001 1 µA
Discharge Switch-On Resistance V
CELL
> 3V (Note 3)
l
10 20 Ω
I
OW
Current Used for Open-Wire Detection
l
70 110 140 µA
Thermal Shutdown Temperature 145 °C
Thermal Shutdown Hysteresis 5 °C
Voltage Mode Timing Specifications
t
CYCLE
Measurement Cycling Time Required to Measure 12 Cells
Time Required to Measure 10 Cells
Time Required to Measure 3 Temperatures
Time Required to Measure 1 Cell or Temperature
l
l
l
l
11
9
2.8
1.0
13
11
3.4
1.2
15
13
4.1
1.4
ms
ms
ms
ms
t
1
SDI Valid to SCKI Rising Setup
l
10 ns
t
2
SDI Valid to SCKI Rising Hold
l
250 ns
t
3
SCKI Low
l
400 ns
t
4
SCKI High
l
400 ns
t
5
CSBI Pulse Width
l
400 ns
t
6
CSBI Falling to SCKI Rising
l
100 ns
t
7
CSBI Falling to SDO Valid
l
100 ns
t
8
SCKI Falling to SDO Valid
l
250 ns
Clock Frequency
l
1 MHz
Watchdog Timer Timeout Period
l
1 2.5 Seconds
Timing Specifications
t
PD1
CSBI to CSBO C
CSBO
= 150pF
l
600 ns
t
PD2
SCKI to SCKO C
SCKO
= 150pF
l
300 ns
t
PD3
SDI to SDOI Write Delay C
SDOI
= 150pF
l
300 ns
t
PD4
SDI to SDOI Read Delay C
SDO
= 150pF
l
300 ns
LTC6803-1/LTC6803-3
5
680313fa
ELECTRICAL CHARACTERISTICS
The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at T
A
= 25°C. V
+
= 43.2V, V
= 0V, unless otherwise noted.
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The ADC specifications are guaranteed by the Total Measurement
Error (V
ERR
) specification.
Note 3: Due to the contact resistance of the production tester, this
specification is tested to relaxed limits. The 20Ω limit is guaranteed by
design.
Note 4: V
CELL
refers to the voltage applied across Cn to Cn – 1 for
n = 1 to 12. V
TEMP
refers to the voltage applied from V
TEMP1
or V
TEMP2
to V
.
Note 5: These absolute maximum ratings apply provided that the voltage
between inputs do not exceed the absolute maximum ratings.
Note 6: Supply current is tested during continuous measuring. The supply
current during periodic measuring (130ms, 500ms, 2s) is guaranteed by
design.
Note 7: The CDC = 5, 6 and 7 supply currents are not measured. They are
guaranteed by the CDC = 2 supply current measurement.
Note 8: Limit is determined by high speed automated test capability.
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
Voltage Mode Digital I/O
V
IH
Digital Input Voltage High Pins SCKI, SDI and CSBI
l
2 V
V
IL
Digital Input Voltage Low Pins SCKI, SDI and CSBI
l
0.8 V
V
OL
Digital Output Voltage Low Pin SDO, Sinking 500µA
l
0.3 V
I
IN
Digital Input Current V
MODE
, TOS, SCKI, SDI, CSBI
l
10 µA
Current Mode Digital I/O
I
IH1
Digital Input Current High Pins CSBI, SCKI, SDI (Write, Pin Sourcing)
l
3 10 µA
I
IL1
Digital Input Current Low CSBI, SCKI, SDI (Write, Pin Sourcing)
l
1000 µA
I
IH2
Digital Input Current High SDOI (Read, Pin Sinking)
l
1000 µA
I
IL2
Digital Input Current Low SDOI (Read, Pin Sinking)
l
10 µA
I
OH1
Digital Output Current High CSBO, SCKO, SDOI (Write, Pin Sinking)
l
3 10 µA
I
OL1
Digital Output Current Low CSBO, SCKO, SDOI(Write, Pin Sinking)
l
1000 1300 1600 µA
I
OH2
Digital Output Current High SDI (Read, Pin Sourcing)
l
1000 1300 1600 µA
I
OL2
Digital Output Current Low SDI (Read, Pin Sourcing)
l
3 10 µA
TYPICAL PERFORMANCE CHARACTERISTICS
Cell Measurement Error
vs Cell Input Voltage
Cell Measurement Error
vs Input RC Values
Cell Measurement Error
vs Input RC Values
CELL INPUT VOLTAGE (V)
–4.5
TOTAL UNADJUSTED ERROR (mV)
–1.5
1.5
4.5
–3.0
0
3.0
1.0 2.0 3.0 4.0
680313 G01
5.00.50 1.5 2.5 3.5 4.5
T
A
= 125°C
T
A
= 85°C
T
A
= 25°C
T
A
= –40°C
INPUT RESISTANCE (kΩ)
0
–30
CELL VOLTAGE ERROR (mV)
–25
–15
–10
–5
5
1
5
7
680313 G02
–20
0
4
9
10
2
3
6 8
C = 0µF
C = 0.1µF
C = 1µF
C = 3.3µF
CELL 1, 13ms CELL MEASUREMENT
REPETITION
V
CELL
= 3.3V
INPUT RESISTANCE (kΩ)
0
–30
CELL VOLTAGE ERROR (mV)
–25
–15
–10
–5
0
1
5
7
680313 G03
–20
4
9
10
2
3
6 8
C = 0µF
C = 0.1µF
C = 1µF
C = 3.3µF
CELLS 2 TO 12, 13ms CELL
MEASUREMENT REPETITION
V
CELL
= 3.3V
LTC6803-1/LTC6803-3
6
680313fa
TYPICAL PERFORMANCE CHARACTERISTICS
Cell Voltage Measurement Error
vs Common Mode Voltage
Cell Measurement Error
vs Cell Voltage
Cell 1 Voltage Measurement Error
vs Temperature
Cell 12 Measurement Error vs V
+
V
+
– V
C12
(V)
–0.8
–0.6 –0.4
CELL 12 MEASUREMENT ERROR (mV)
1
10
100
–0.2 0 0.2 0.4 0.6 1.00.8
680313 G04
0.1
T
A
= 25°C
V
CELL
= 3.3V
COMMON MODE VOLTAGE (V)
0
CELL MEASUREMENT ERROR (mV)
–8
–6
–4
3
5
680313 G05
–10
–12
–14
1 2 4
–2
0
2
CELL2 ERROR vs V
C1
CELL3 ERROR vs V
C2
CELLn ERROR VS V
Cn–1
,
n = 4 TO 12
V
CELL
= 3.6V
T
A
= 25°C
V
IN
CELL6 (V)
1
CELL VOLTAGE MEASUREMENT ERROR (mV)
10
100
1000
–1.0 –0.2 0.2 0.6
0.1
–0.6
1.0–0.4 0 0.4–0.8 0.8
680313 G06
CELL6
ALL OTHER CELLS = 3V
TEMPERATURE (°C)
–50
–2.00
CELL MEASUREMENT ERROR (mV)
–1.25
0.25
1.00
1.75
–10
30
50 130
680313 G07
–0.50
–30 10
70
90
110
V
CELL
= 0.8V
V
+
= 9.6V
4 SAMPLES
Cell 2 Voltage Measurement Error
vs Temperature
TEMPERATURE (°C)
–50
–2.00
CELL MEASUREMENT ERROR (mV)
–1.25
0.25
1.00
2.50
1.75
–10
30
50 130
680313 G08
–0.50
–30 10
70
90
110
V
CELL
= 0.8V
V
+
= 9.6V
4 SAMPLES
Cell 3 to Cell 12 Voltage
Measurement Error vs Temperature
TEMPERATURE (°C)
–50
–2.00
CELL MEASUREMENT ERROR (mV)
–1.25
0.25
1.00
1.75
–10
30
50 130
680313 G09
–0.50
–30 10
70
90
110
V
CELL
= 0.8V
V
+
= 9.6V
4 SAMPLES
Measurement Gain Error
Hysteresis
Cell Measurement Common Mode
Rejection
CHANGE IN GAIN ERROR (ppm)
–250
NUMBER OF UNITS
25
20
15
10
5
0
–50 150–150 50
680313 G10
200–100 100–200 0
T
A
= 85°C TO 25°C
Measurement Gain Error
Hysteresis
CHANGE IN GAIN ERROR (ppm)
–250
NUMBER OF UNITS
20
16
12
8
4
18
14
10
6
2
0
–50 150–150 50
680313 G11
200–100 100–200 0
T
A
= –45°C TO 25°C
0
–10
–30
–50
–20
–40
–60
–70
FREQUENCY (Hz)
REJECTION (dB)
680313 G12
10 10k 10M1M100k1k100
V
CM(IN)
= 5V
P-P
72dB REJECTION
CORRESPONDS TO
LESS THAN 1 BIT
AT ADC OUTPUT

LTC6803IG-3#TRPBF

Mfr. #:
Manufacturer:
Analog Devices / Linear Technology
Description:
Battery Management Battery Stack Monitor, Daisy Chain SPI
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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