LTC6803-1/LTC6803-3
5
680313fa
ELECTRICAL CHARACTERISTICS
The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at T
A
= 25°C. V
+
= 43.2V, V
–
= 0V, unless otherwise noted.
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The ADC specifications are guaranteed by the Total Measurement
Error (V
ERR
) specification.
Note 3: Due to the contact resistance of the production tester, this
specification is tested to relaxed limits. The 20Ω limit is guaranteed by
design.
Note 4: V
CELL
refers to the voltage applied across Cn to Cn – 1 for
n = 1 to 12. V
TEMP
refers to the voltage applied from V
TEMP1
or V
TEMP2
to V
–
.
Note 5: These absolute maximum ratings apply provided that the voltage
between inputs do not exceed the absolute maximum ratings.
Note 6: Supply current is tested during continuous measuring. The supply
current during periodic measuring (130ms, 500ms, 2s) is guaranteed by
design.
Note 7: The CDC = 5, 6 and 7 supply currents are not measured. They are
guaranteed by the CDC = 2 supply current measurement.
Note 8: Limit is determined by high speed automated test capability.
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
Voltage Mode Digital I/O
V
IH
Digital Input Voltage High Pins SCKI, SDI and CSBI
l
2 V
V
IL
Digital Input Voltage Low Pins SCKI, SDI and CSBI
l
0.8 V
V
OL
Digital Output Voltage Low Pin SDO, Sinking 500µA
l
0.3 V
I
IN
Digital Input Current V
MODE
, TOS, SCKI, SDI, CSBI
l
10 µA
Current Mode Digital I/O
I
IH1
Digital Input Current High Pins CSBI, SCKI, SDI (Write, Pin Sourcing)
l
3 10 µA
I
IL1
Digital Input Current Low CSBI, SCKI, SDI (Write, Pin Sourcing)
l
1000 µA
I
IH2
Digital Input Current High SDOI (Read, Pin Sinking)
l
1000 µA
I
IL2
Digital Input Current Low SDOI (Read, Pin Sinking)
l
10 µA
I
OH1
Digital Output Current High CSBO, SCKO, SDOI (Write, Pin Sinking)
l
3 10 µA
I
OL1
Digital Output Current Low CSBO, SCKO, SDOI(Write, Pin Sinking)
l
1000 1300 1600 µA
I
OH2
Digital Output Current High SDI (Read, Pin Sourcing)
l
1000 1300 1600 µA
I
OL2
Digital Output Current Low SDI (Read, Pin Sourcing)
l
3 10 µA
TYPICAL PERFORMANCE CHARACTERISTICS
Cell Measurement Error
vs Cell Input Voltage
Cell Measurement Error
vs Input RC Values
Cell Measurement Error
vs Input RC Values
CELL INPUT VOLTAGE (V)
–4.5
TOTAL UNADJUSTED ERROR (mV)
–1.5
1.5
4.5
–3.0
0
3.0
1.0 2.0 3.0 4.0
680313 G01
5.00.50 1.5 2.5 3.5 4.5
T
A
= 125°C
T
A
= 85°C
T
A
= 25°C
T
A
= –40°C
INPUT RESISTANCE (kΩ)
0
–30
CELL VOLTAGE ERROR (mV)
–25
–15
–10
–5
5
1
5
7
680313 G02
–20
0
4
9
10
2
3
6 8
C = 0µF
C = 0.1µF
C = 1µF
C = 3.3µF
CELL 1, 13ms CELL MEASUREMENT
REPETITION
V
CELL
= 3.3V
INPUT RESISTANCE (kΩ)
0
–30
CELL VOLTAGE ERROR (mV)
–25
–15
–10
–5
0
1
5
7
680313 G03
–20
4
9
10
2
3
6 8
C = 0µF
C = 0.1µF
C = 1µF
C = 3.3µF
CELLS 2 TO 12, 13ms CELL
MEASUREMENT REPETITION
V
CELL
= 3.3V