13
AT49LD3200(B)
1940B–FLASH–11/01
Latency There are latencies between the issuance of a Row Active command and when data is
available on the I/O buffers. The RAS
to CAS delay is defined as the RAS latency. The
CAS to data out delay is the CAS latency. The CAS and RAS latencies are programma-
ble through the mode register. RAS latencies of 1 and 2, and CAS latencies of 2 through
6 are supported. It is understood that some RAS and CAS latency values are reserved
for future use, and are not available in this generation of synchronous Flash. The follow-
ing are the supported minimum values: RAS latency = 2, and CAS latency = 6 for 100
MHz operation, and RAS latency = 2, and CAS latency = 5 for 66 MHz operation, and
RAS latency = 1, and CAS latency = 4 for 50 MHz operation, and RAS latency = 1, and
CAS latency = 3 for 33 MHz operation.
DQM Operation The DQM is used to mask output operations when a complete burst read is not required.
It works similar to OE
during a read operation. The read latency is two cycles from DQM,
which means DQM masking occurs two cycles later in the read cycle. DQM operation is
synchronous with the clock. The masking occurs for a complete cycle. (Also refer to the
DQM timing diagram.)
Burst Read The Burst Read command is used to access a burst of data on consecutive clock cycles
from an active row state. The Burst Read command is issued by asserting low CS
and
CAS
with MR being high on the rising edge of the clock. The first output appears in CAS
latency number of clock cycles after the issuance of the Burst Read command. The
burst length, burst sequence and latency from the Burst Read command are determined
by the mode register, which is already programmed. Burst read can be initiated on any
column address of the active row. The output goes into high-impedance at the end of
the burst, unless a new burst read is initiated to keep the data output gapless. The burst
read can be terminated by issuing another burst read.
Sector Erase Before a word/double word can be reprogrammed, it must be erased. The erased state
of the memory bits is a logical “1”. The AT49LD3200(B) is organized into eight uniform
four megabit sectors (SA0 - SA7) that can be individually erased. The Sector Erase
command is a synchronous six-bus cycle operation (refer to the Command Definition
table and Program Cycle and Erase Cycle waveforms). The erase code consists of 6-
byte (DQ8 - DQ31 are Don’t Care inputs for the command) load commands to specific
address locations with a specific data pattern. The sector address and 30H data input
are latched in the sixth cycle. The sector erase starts at the following rising edge of CLK
after the sixth cycle. The erase operation is internally controlled; it will automatically time
to completion.
Any commands written to the device during the erase cycle will be ignored. The maxi-
mum time needed to erase one sector is t
EC
.
Word/Double Word
Programming
Once a sector is erased, it is programmed (to a logical “0”) on a word-by-word/double-
word-by-double-word basis. Programming is accomplished via the internal device com-
mand register and is synchronous four-bus cycle operation (refer to the Command
Definition table and Program Cycle and Erase Cycle waveforms). The programming
operation starts at the following rising edge of CLK after the fourth cycle. The device will
automatically generate the required internal program pulses.
Any commands written to the device during the embedded programming cycle will be
ignored. Please note that a data “0” cannot be programmed back to a “1”; only erase
operations can convert “0”s to “1”s. Programming is completed after the specified t
PGM
cycle time. The DATA polling feature may also be used to indicate the end of a program
cycle.
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AT49LD3200(B)
1940B–FLASH–11/01
Product Identification The product identification mode identifies the device and manufacturer as Atmel. This
mode can be used by an on-board controller or external programmer to identify the cor-
rect programming algorithm for the Atmel product.
DATA Polling The AT49LD3200(B) features DATA polling to indicate the end of a program or sector
erase cycle. DATA
polling may begin at any time during the program or sector erase
cycle.
During a program cycle, an attempted read of the last word/double word loaded will
result in the complement of the loaded data in DQ7. Once the program cycle has com-
pleted, true valid data can be read on all outputs and the next cycle may begin.
During a sector erase operation, an attempt to read the device will give a “0” on DQ7.
Once the sector erase cycle has completed, logical “1” data can be read on all outputs
from the device.
Hardware Data
Protection
Hardware features protect against inadvertent programming or erasure to the
AT49LD3200(B) in the following way: V
CC
sense: if V
CC
is below 2.3V (typical), the pro-
gram or erase function is inhibited; but if V
CC
dips below 2.3V during program or erase
cycle, the respective function will be interrupted and the data at the location being pro-
grammed may be corrupted.
Continuity Test Mode The AT49LD3200(B) has built-in circuitries to make input and output pin continuity
check simple and easy. This mode can be activated via the internal device command
register and is a synchronous five-bus cycle operation (refer to the Command Definition
Table and Continuity Test Mode Entry Waveforms). After the bus cycle operation, keep
DQM high (V
IH
) and allow 5 µsec for circuit setup time or until data is no longer asserted
at DQ0 - DQ7, whichever takes longer. This will keep DQ0 - DQ7 from contention since
data is asserted at DQ0 - DQ7 during the mode entry sequence. Then DQM can be
asserted low (V
IL
) to enable DQ0 - DQ7 for test. Once in this asynchronous mode, input
pins are virtually tied to output pins internally forming input - output pin pairs. The output
pin of the pair will follow the logic state of the input pin of the pair (refer to the Input -
Output Pin Pairs table). To exit the mode, A
0
, A
2
and A
II
are asserted high (V
IH
) and A
1
,
A
10
and A
12
are asserted low (V
IL
), allow 5 µsec for circuit recovery time before returning
the device for normal operation.
15
AT49LD3200(B)
1940B–FLASH–11/01
Asynchronous Boot
Block
The AT49LD3200B will automatically activate the Asynchronous Boot Block after
power-up and the AT49LD3200 can activate the Asynchronous Boot Block through the
Mode Register Set. The size of the boot block is 8K x 16 bits with addresses A
0
~ A
12
and outputs DQ
0
~ DQ
15
. The contents of the boot block are accessed asynchronously,
meaning the data at outputs will change according to the address inputs after t
ACC
, with-
out any external clocking signals.
Programs and erases are performed using the synchronous bus cycle operation (refer
to Command Definitions table and Program Cycle and Erase Cycle waveforms) after the
boot block is activated either through power-up or Mode Register Set. Programming of
the boot block is set up for x16 mode.
This Asynchronous Boot Block has a lockout feature that prevents programming or
erasing of data in this boot block once the feature has been enabled. This feature does
not have to be activated; the boot block’s usage as a protected region is optional to the
user. Once this feature is enabled, the data in the boot block can no longer be erased or
programmed when input levels of 3.6V or less are used. To activate the lockout feature,
Input - Output Pin Pairs
Input Output
MR
DQ0, DQ16
RAS
DQ1, DQ17
CAS
DQ2
DQM DQ18
CS
DQ3
WORD DQ19
A12 DQ4
A11 DQ20
A10 DQ5
A0 DQ21
A1 DQ6, DQ22
A2 DQ7, DQ23
A3 DQ8, DQ24
A4 DQ9, DQ25
A5 DQ10
A6 DQ26
A7 DQ11
A8 DQ27
A9 DQ12
CKE DQ28
CLK DQ13, DQ29
WE
DQ14, DQ30
VPP DQ15, DQ31

AT49LD3200-13TC

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
NOR Flash 32M bit
Lifecycle:
New from this manufacturer.
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