4
AT49LD3200(B)
1940B–FLASH–11/01
Functional Block Diagram
Absolute Maximum Ratings*
Temperature under Bias ................................ -55°C to +125°C
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Storage Temperature..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground.....................................-0.6V to +4.6V
All Output Voltages
with Respect to Ground.............................-0.6V to V
CC
+ 0.6V
Voltage on V
PP
with Respect to Ground...................................-0.6V to +13.5V
Power Dissipation.............................................................. 1 W
Timing Register
Programming Register
Latency & Burst Length
Column Decoder
1M x 32
Cell Array
IO Buffer
Program/
Erase
Logic
WE
VPP
CLK
CLK
ADD
DQ15
CS
CASRASMR
DQ16DQ0
CKE
LRAS
LRAS
LCKE
LCAS
LMR
DQ31
DQM
Address Register
Row Buffer
Row Decoder
Sense AMP
Column Buffer
8K x 16 Boot Block
ADD
5
AT49LD3200(B)
1940B–FLASH–11/01
Notes: 1. V
IH
(max) = 4.6V for pulse width <10 ns acceptable, pulse width measured at 50% of pulse amplitude.
2. V
IL
(min) = -1.5V for pulse width <10 ns acceptable, pulse width measured at 50% of pulse amplitude.
Note: 1. If CLK transition time is longer than 1 ns, timing parameters should be compensated. Add [(t
r
+ t
f
)/2-1] ns for transition time
longer than 1 ns. Transition time is measured between V
IL
(max) and V
IH
(min).
DC and AC Operating Range
AT49LD3200(B)-10 AT49LD3200(B)-13 AT49LD3200(B)-20
Operating Temperature
(Case)
Commercial 0°C - 70°C0°C - 70°C0°C - 70°C
Industrial -40°C - 85°C-40°C - 85°C-40°C - 85°C
V
CC
, V
CCQ
Power Supply 3.0V to 3.6V 3.0V to 3.6V 3.0V to 3.6V
DC Characteristics
Symbol Parameter Condition Min Max Units
I
SB1
V
CC
Standby Current CMOS CKE = 0, t
CC
= Min 20 mA
I
SB2
V
CC
Standby Current TTL CKE £ V
IL
(Max), t
CC
= Min 20 mA
I
SB3
V
CC
Active Standby Current CS ³ V
IH
(Min), t
CC
= Min 50 mA
I
CC
V
CC
Active Current t
CC
= Min, All Outputs Open 150 mA
I
IL
Input Leakage Current
0V £ V
IN
£ V
DD
+ 0.3V
Pins not under test = 0V
-10 10 µA
I
OL
Output Leakage Current (IO
OUT
Disabled)
(0V £ V
OUT
£ V
DD
Max)
All Outputs in High-Z
-10 10 µA
V
IH
Input High Voltage, All Inputs Note
(1)
2.0 V
DD
+ 0.3 V
V
IL
Input Low Voltage, All Inputs Note
(2)
-0.3 0.8 V
V
OH
Output High Voltage Level (Logic 1) I
OH
= -2 mA 2.4 V
V
OL
Output Low Voltage Level (Logic 0) I
OL
= 2 mA 0.4 V
AC Operating Test Conditions
T
A
= 0 to 70°C, V
CC
= 3.3V ± 0.3V, unless otherwise noted.
Parameter
(1)
Value
Timing Reference Levels of Input/Output Signals 1.4V
Input Signal Levels V
IH
/V
IL
= 2.4V/0.4V
Transition Time (Rise & Fall) of Input Signals t
r
/t
f
= 1 ns/1 ns
Output Load LVTTL
6
AT49LD3200(B)
1940B–FLASH–11/01
Figure 1. DC Output Load Circuit
Figure 2. AC Output Load Circuit
Notes: 1. This parameter is characterized and is not 100% tested.
2. V
PP
behaves as an output pin.
Pin Capacitance
(1)
f = 1 MHz, T = 25°C
Symbol Typ Max Units Conditions
C
IN
46pFV
IN
= 0V
C
OUT
(2)
812pFV
OUT
= 0V
3.3V
1200
870
Out
p
ut
50
p
F
V
OH
(
DC
)
= 2.4V, I
= -2 mA
V
OL
(
DC
)
= 0.4V, I
OL
= 2 mA
Vtt = 1.4V
50Ω
Out
p
ut
50
p
F
Z0 = 50

AT49LD3200-13TC

Mfr. #:
Manufacturer:
Microchip Technology / Atmel
Description:
NOR Flash 32M bit
Lifecycle:
New from this manufacturer.
Delivery:
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