IDT80KSW0002 Datasheet
CPS-16 Datasheet 47 April 6, 2016
17 JTAG Interface
Description
The CPS-16 offers full JTAG (Boundary Scan) support for both its slow speed and high speed pins. This allows “pins-down” testing of newly manufac-
tured printed circuit boards as well as troubleshooting of field returns. The JTAG TAP interface also offers an alternative method for Configuration
Register Access (CRA) (along with the sRIO and I
2
C ports). Thus this port may be used for programming the CPS-16’s many registers.
Boundary scan testing of the AC-coupled IOs is performed in accordance with IEEE 1149.6 (AC Extest).
IEEE 1149.1 (JTAG) & IEEE 1149.6 (AC Extest) Compliance
All DC pins are in full compliance with IEEE 1149.1 [10]. All AC-coupled pins fully comply with IEEE 1149.6 [11]. All 1149.1 and 1149.6 boundary
scan cells are on the same chain. No additional control cells are provided for independent selection of negative and/or positive terminals of the TX- or
RX-pairs.
System Logic TAP Controller Overview
The system logic utilizes a 16-state, six-bit TAP controller, a four-bit instruction register, and five dedicated pins to perform a variety of functions. The
primary use of the JTAG TAP Controller state machine is to allow the five external JTAG control pins to control and access the CPS-16's many
external signal pins. The JTAG TAP Controller can also be used for identifying the device part number. The JTAG logic of the CPSCPS is depicted in
the figure below.
Figure 19 Diagram of the JTAG Logic
Bypass Register
Instruction Register Decoder
4-Bit Instruction Register
Tap Controller
m
u
x
m
u
x
Device ID Register
Boundary Scan Register
TDI
TMS
TCK
TRST
TDO
IDT80KSW0002 Datasheet
CPS-16 Datasheet 47 April 6, 2016
Signal Definitions
JTAG operations such as Reset, State-transition control and Clock sampling are handled through the signals listed in the table below. A functional
overview of the TAP Controller and Boundary Scan registers is provided in the sections following the table.
The system logic TAP controller transitions from state to state, according to the value present on TMS, as sampled on the rising edge of TCK. The
Test-Logic Reset state can be reached either by asserting TRST or by applying a 1 to TMS for five consecutive cycles of TCK. A state diagram for the
TAP controller appears in Figure 20. The value next to state represent the value that must be applied to TMS on the next rising edge of TCK, to transi-
tion in the direction of the associated arrow.
Figure 20 State Diagram of the CPS-16’s TAP Controller
Pin Name Type Description
TRST
Input JTAG RESET
Asynchronous reset for JTAG TAP controller (internal pull-up)
TCK Input JTAG Clock
Test logic clock. JTAG_TMS and JTAG_TDI are sampled on the rising edge.
JTAG_TDO is output on the falling edge.
TMS Input JTAG Mode Select. Requires an external pull-up.
Controls the state transitions for the TAP controller state machine (internal pull-up)
TDI Input JTAG Input
Serial data input for BSC chain, Instruction Register, IDCODE register, and BYPASS
register (internal pull-up)
TDO Output JTAG Output
Serial data out. Tri-stated except when shifting while in Shift-DR and SHIFT-IR TAP
controller states.
Table 26 JTAG Pin Descriptions
Test- Logic
Reset
Run-Test/
Idle
Select-
DR-Scan
Capture-DR
Shift-DR
Exit1 -DR
Pause-DR
Exit2-DR
Select-
IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Exit2-IR
Update-DR Update-IR
11
0
00
11
0
0
1
1
0
1
0
1
0
0
1
1
1
0
0
11
0
1
0
1
1
0
00
0
IDT80KSW0002 Datasheet
CPS-16 Datasheet 47 April 6, 2016
Test Data Register (DR)
The Test Data register contains the following:
?
The Bypass register
?
The Boundary Scan registers
?
The Device ID register
These registers are connected in parallel between a common serial input and a common serial data output, and are described in the following
sections. For more detailed descriptions, refer to IEEE Standard Test Access port (IEEE Std. 1149.1-1990).
Boundary Scan Registers
The CPS-16 boundary scan chain is 70 bits long. The five JTAG pins do not have scan elements associated with them. Full boundary scan details can
be found in the associated BSDL file which may be found on our web site (www.IDT.com). The boundary scan chain is connected between TDI and
TDO when the EXTEST or SAMPLE/PRELOAD instructions are selected. Once EXTEST is selected and the TAP controller passes through the
UPDATE-IR state, whatever value that is currently held in the boundary scan register’s output latches is immediately transferred to the corresponding
outputs or output enables.
Therefore, the SAMPLE/PRELOAD instruction must first be used to load suitable values into the boundary scan cells, so that inappropriate values are
not driven out onto the system pins. All of the boundary scan cells feature a negative edge latch, which guarantees that clock skew cannot cause
incorrect data to be latched into a cell. The input cells are sample-only cells. The simplified logic configuration is shown in the figure below.
Figure 21 Diagram of Observe-only Input Cell
The simplified logic configuration of the output cells is shown in the figure below.
Figure 22 Diagram of Output Cell
Input
Pin
shift_dr
From previous cell
clock_dr
DQ
To next cell
To core logic
MUX
Data from Core
Data from Previous Cell
shift_dr
To Next Cell
To Output Pad
clock_dr
update_dr
MUX
D
Q
DQ
EXTEST
MUX

80KSW0002ALG

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IDT
Description:
Switch ICs - Various 80KSW0002 Central Packet SW-16 ports
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New from this manufacturer.
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