UJA1066_2 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 03 — 17 March 2010 51 of 70
NXP Semiconductors
UJA1066
High-speed CAN fail-safe system basis chip
[1] All parameters are guaranteed over the virtual junction temperature range by design. Products are 100 % tested at 125 °C ambient
temperature on wafer level (pretesting). Cased products are 100 % tested at 25 °C ambient temperature (final testing). Both pretesting
and final testing use correlated test conditions to cover the specified temperature and power supply voltage range.
[2] V
V1(nom)
is 3.3 V or 5 V, depending on the SBC version.
[3] Not tested in production.
[4] V2 internally supplies the SBC CAN transceiver. The supply current needed for the CAN transceiver reduces the pin V2 output
capability. The performance of the CAN transceiver can be impaired if V2 is also used to supply other circuitry while the CAN transceiver
is in use.
Temperature detection
T
j(warn)
high junction
temperature warning
level
160 175 190 °C
Table 26. Static characteristics
…continued
T
vj
=
−
40
°
C to +150
°
C, V
BAT42
= 5.5 V to 52 V; V
BAT14
= 5.5 V to 27 V; V
BAT42
≥
V
BAT14
−
1 V; unless otherwise specified. All
voltages are defined with respect to ground. Positive currents flow into the IC.
[1]
Symbol Parameter Conditions Min Typ Max Unit