BULK ERASE
The BULK ERASE command sets all bits to 1 (FFh). Before the BULK ERASE command
can be accepted, a WRITE ENABLE command must have been executed previously. Af-
ter the WRITE ENABLE command has been decoded, the device sets the write enable
latch (WEL) bit.
The BULK ERASE command is entered by driving chip select (S#) LOW, followed by the
command code on serial data input (DQ0). S# must be driven LOW for the entire dura-
tion of the sequence.
S# must be driven HIGH after the eighth bit of the command code has been latched in.
Otherwise the BULK ERASE command is not executed. As soon as S# is driven HIGH,
the self-timed BULK ERASE cycle is initiated; the cycle's duration is t
BE
. While the BULK
ERASE cycle is in progress, the status register may be read to check the value of the write
In progress (WIP) bit. The WIP bit is 1 during the self-timed BULK ERASE cycle, and is 0
when the cycle is completed. At some unspecified time before the cycle is completed,
the WEL bit is reset.
The BULK ERASE command is executed only if all block protect (BP2, BP1, BP0) bits are
0. The BULK ERASE command is ignored if one or more sectors are protected.
Figure 18: BULK ERASE Command Sequence
7
0
C
MSB
DQ0
LSB
Command
M25P128 Serial Flash Embedded Memory
BULK ERASE
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
28
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
Power-Up/Down and Supply Line Decoupling
At power-up and power-down, the device must not be selected; that is, chip select (S#)
must follow the voltage applied on V
CC
until V
CC
reaches the correct value:
V
CC,min
at power-up, and then for a further delay of
t
VSL
V
SS
at power-down
A safe configuration is provided in the SPI Modes section.
To avoid data corruption and inadvertent WRITE operations during power-up, a power-
on-reset (POR) circuit is included. The logic inside the device is held reset while V
CC
is
less than the POR threshold voltage, V
WI
– all operations are disabled, and the device
does not respond to any instruction. Moreover, the device ignores the following instruc-
tions until a time delay of
t
PUW has elapsed after the moment that V
CC
rises above the
V
WI
threshold:
WRITE ENABLE
PAGE PROGRAM
SECTOR ERASE
BULK ERASE
WRITE STATUS REGISTER
However, the correct operation of the device is not guaranteed if, by this time, V
CC
is still
below V
CC.min
. No WRITE STATUS REGISTER, PROGRAM, or ERASE instruction should
be sent until:
t
PUW after V
CC
has passed the V
WI
threshold
t
VSL after V
CC
has passed the V
CC,min
level
If the time,
t
VSL, has elapsed, after V
CC
rises above V
CC,min
, the device can be selected
for READ instructions even if the
t
PUW delay has not yet fully elapsed.
V
PPH
must be applied only when V
CC
is stable and in the V
CC,min
to V
CC,max
voltage
range.
M25P128 Serial Flash Embedded Memory
Power-Up/Down and Supply Line Decoupling
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
29
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
Figure 19: Power-Up Timing
V
CC
V
CC,min
V
WI
RESET state
of the
device
Chip selection not allowed
PROGRAM, ERASE, and WRITE commands are rejected by the device
t
VSL
t
PUW
Time
READ access allowed Device fully
accessible
V
CC,max
After power-up, the device is in the following state:
Standby power mode
Write enable latch (WEL) bit is reset
Normal precautions must be taken for supply line decoupling to stabilize the V
CC
sup-
ply. Each device in a system should have the V
CC
line decoupled by a suitable capacitor
close to the package pins; generally, this capacitor is of the order of 0.1µF.
At power-down, when V
CC
drops from the operating voltage to below the POR threshold
voltage V
WI
, all operations are disabled and the device does not respond to any instruc-
tion.
Note: If power-down occurs while a WRITE, PROGRAM, or ERASE cycle is in progress,
some data corruption may result.
Power-Up Timing and Write Inhibit Voltage Threshold Specifications
Table 7: Power-Up Timing and V
WI
Threshold
Symbol Parameter Min Max Unit
t
VSL V
CC,min
to S# LOW 200 μs
t
PUW Time delay to WRITE instruction 400 μs
V
WI
Write Inhibit voltage 1.5 2.5 V
Note:
1. Parameters are characterized only.
M25P128 Serial Flash Embedded Memory
Power-Up Timing and Write Inhibit Voltage Threshold Specifi-
cations
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
30
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.

M25P128-VME6GB

Mfr. #:
Manufacturer:
Micron
Description:
IC FLASH 128M SPI 54MHZ 8VDFPN
Lifecycle:
New from this manufacturer.
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