Maximum Ratings and Operating Conditions
Note: Stressing the device beyond the absolute maximum ratings may cause permanent
damage to the device. These are stress ratings only and operation of the device beyond
any specification or condition in the operating sections of this datasheet is not recom-
mended. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
Table 8: Absolute Maximum Ratings
Symbol Parameter Min Max Units Notes
T
STG
Storage temperature –65 150 °C
V
IO
Input and output voltage (with respect to
ground)
–0.5 V
CC
+ 0.6 V 1
V
CC
Supply voltage –0.2 4.0 V
V
PP
FAST PROGRAM and ERASE voltage –0.2 10.0 V
V
ESD
Electrostatic discharge voltage (Human Body
model)
–2000 2000 V 2
Notes:
1. The minimum voltage may reach the value of –2V for no more than 20ns during transi-
tions; the maximum may reach the value of V
CC
+ 2V for no more than 20ns during tran-
sitions.
2. The V
ESD
signal: JEDEC Std JESD22-A114A (C1 = 100pF, R1 = 1500Ω, R2 = 500Ω).
Table 9: Operating Conditions
Symbol Parameter Min Typ Max Unit
V
CC
Supply voltage 2.7 – 3.6 V
V
PPH
Supply voltage on W#/V
PP
pin for FAST PRO-
GRAM and ERASE
8.5 – 9.5 V
T
A
Ambient operating temperature –40 85 °C
T
AVPP
Ambient operating temperature for FAST
PROGRAM and ERASE
15 25 35 °C
M25P128 Serial Flash Embedded Memory
Maximum Ratings and Operating Conditions
CCMTD-1718347970-10412
m25p_128.pdf - Rev. A 11/16 EN
32
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